Patents by Inventor Sung Won CHOO

Sung Won CHOO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Operating method of host device and storage device and storage device
    Patent number: 11928363
    Abstract: A method of operating a host device to control a storage device which includes a register is provided. The method includes: providing the storage device with a partial array refresh setting indicating a non-masking segment among a masking segment and the non-masking segment; providing a refresh command to the storage device; and providing a write command for the masking segment to the storage device to control the storage device to store data while a partial array refresh is performed in the storage device based on the refresh command.
    Type: Grant
    Filed: April 5, 2022
    Date of Patent: March 12, 2024
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Jun Ha Hwang, Chul-Hwan Choo, Gye Sik Oh, Young Bin Lee, Sung Won Jo
  • Substrate testing cartridge and method for manufacturing same
    Patent number: 11226367
    Abstract: The present invention relates to a substrate testing cartridge provided for simultaneously testing multiple substrates for which a substrate treatment process has been finished, and a method for manufacturing same. According to an embodiment of the present invention, a substrate testing cartridge comprises: a chuck member on which a substrate is placed; a probe card which contacts and tests the substrate and is positioned to face the chuck member with reference to the substrate; and coupling members which couple the substrate, the chuck member, and the probe card, wherein each coupling member comprises: a substrate coupling part which couples the substrate and the chuck member; and a chuck coupling part which couples the probe card and the chuck member.
    Type: Grant
    Filed: August 21, 2018
    Date of Patent: January 18, 2022
    Assignee: KOREA INSTITUTE OF INDUSTRIAL TECHNOLOGY
    Inventors: Kyung Tae Nam, Sang Moo Lee, Seung Joon Lee, Kwang Hee Lee, Sung Won Choo
  • SUBSTRATE TESTING CARTRIDGE AND METHOD FOR MANUFACTURING SAME
    Publication number: 20200249272
    Abstract: The present invention relates to a substrate testing cartridge provided for simultaneously testing multiple substrates for which a substrate treatment process has been finished, and a method for manufacturing same. According to an embodiment of the present invention, a substrate testing cartridge comprises: a chuck member on which a substrate is placed; a probe card which contacts and tests the substrate and is positioned to face the chuck member with reference to the substrate; and coupling members which couple the substrate, the chuck member, and the probe card, wherein each coupling member comprises: a substrate coupling part which couples the substrate and the chuck member; and a chuck coupling part which couples the probe card and the chuck member.
    Type: Application
    Filed: August 21, 2018
    Publication date: August 6, 2020
    Inventors: Kyung Tae NAM, Sang Moo LEE, Seung Joon LEE, Kwang Hee LEE, Sung Won CHOO