Abstract: A wafer level package includes: a substrate; an element portion disposed on one surface of the substrate; a cap disposed on the substrate to cover the element portion; a connection portion electrically connected to the element portion; and a bonding portion disposed on an outer side of the connection portion, wherein the bonding portion is disposed on a first surface of one of the substrate and the cap, wherein one end portion of the connection portion is disposed on a second surface having a step difference from the first surface, and wherein the connection portion and the bonding portion are formed of a eutectic material.

Abstract: A wafer processing system includes an optical apparatus including a beam splitter configured to receive a laser beam and to split the laser beam into a first beam in a first state of linear polarization and a second beam in a second state of linear polarization; and a beam delayer configured to delay the second beam so that a pulse of the second beam has a delay time with respect to a pulse of the first beam.

Abstract: An embodiment of the present disclosure discloses tobacco material including: a center portion including a flavor material; and an outer portion including a tobacco mixture, wherein the outer portion surrounds the center portion.

Abstract: The present disclosure relates to a system and a method for providing personal information for an online service system. More particularly, the present disclosure relates to a system and a method for providing personal information using a one-time private key based on a blockchain of proof of use, wherein personal information is registered and stored in a distributed manner in a blockchain network, services in online and offline service systems are used by using alternative authentication identification information that is anonymous and includes a public key to access the personal information in the blockchain network, and for membership registration and login, only the alternative authentication identification information is used to receive a service, become a member of a service, and to log in, without providing the personal information.

Abstract: A method for controlling driving of a hybrid electric vehicle includes collecting driving data while the hybrid electric vehicle is driven, determining whether the hybrid electric vehicle enters a first mode corresponding to emergency driving of the hybrid electric vehicle or a second mode corresponding to control in preparation for the emergency driving, and controlling the hybrid electric vehicle in accordance with a mode that the hybrid electric vehicle enters among the first mode and the second mode.

Abstract: A semiconductor memory device includes: a gate stack structure including a plurality of conductive patterns; a channel structure disposed inside the gate stack structure, the channel structure having a cross-sectional structure including a major axis and a minor axis, which faces in directions intersecting each other; and two or more bit lines extending in a direction intersecting the major axis of the channel structure, the two or more bit lines being arranged to be spaced apart from each other in a direction in which the major axis of the channel structure faces.

Abstract: There are provided a semiconductor memory device and a manufacturing method thereof. The semiconductor memory device includes a first select group and a second select group isolated from each other by an isolation insulating layer; an upper gate stack structure extending to overlap with the first select group, the isolation insulating layer, and the second select group; channel structures extending to penetrate the first select group, the second select group, and the upper gate stack structure; and a vertical connection structure spaced apart from the first select group, the second select group, and the upper gate stack structure, the vertical connection structure extending in parallel to the channel structures.

Abstract: A three-dimensional (3D) semiconductor device includes a plurality of stack structures, a plurality of channel plugs, a slit structure and a plurality of dummy channel plugs. The stack structures include at least two conductive layers and at least two insulation layers, each being alternately stacked. The channel plugs are vertically formed through the stack structure. The slit structure is arranged at one side of the stack structure. The plurality of dummy channel plugs is arranged in the stack structures to be adjacent to the slit structure. Each of the channel plugs includes a channel insulation layer and a channel layer. Each of the dummy channel plugs includes at least one of the channel insulation layer, the channel layer, and a material of the plurality of conductive layers.

Abstract: There are provided a semiconductor device and a manufacturing method of the semiconductor device. The semiconductor device includes: a gate structure including conductive layers and insulating layers, which are alternately stacked; a plurality of channel structures penetrating the gate structure, the plurality of channel structures being arranged in a first direction; a plurality of cutting structures each isolating each of the plurality of channel structures, respectively, into a plurality of divided channel structures while penetrating each of the plurality of channel structures, respectively; and a plurality of interconnection lines located over the gate structure and extending in the first direction. Each of the plurality of cutting structures has substantially a cross (+) shape including extension parts extending in directions oblique to the first direction.

Abstract: A semiconductor memory device includes an electrode structure, a plurality of channel posts, and at least one gate separation layer. The electrode structure includes insulating interlayers and gate conductive layers which are alternately stacked. The channel posts are formed through the electrode structure. The gate separation layer is formed between the channel posts. The gate separation layer separates an uppermost gate conductive layer among the gate conductive layers. Each channel post among the channel posts adjacent to the gate separation layer has a gibbous moon shape in a planar view. The semiconductor memory device further includes a slit structure arranged at both sides of the gate separation layer. The slit structure is formed through the electrode structure. Each channel post among the channel posts adjacent to the slit structure has a gibbous moon shape in the planar view.

Abstract: There are provided a semiconductor memory device and a manufacturing method thereof. The semiconductor memory device includes a first select group and a second select group isolated from each other by an isolation insulating layer; an upper gate stack structure extending to overlap with the first select group, the isolation insulating layer, and the second select group; channel structures extending to penetrate the first select group, the second select group, and the upper gate stack structure; and a vertical connection structure spaced apart from the first select group, the second select group, and the upper gate stack structure, the vertical connection structure extending in parallel to the channel structures.

Abstract: A semiconductor memory device includes a substrate including a cell area and a peripheral area defined by a periphery of the cell area, the cell area including a dummy cell area and a normal cell area, and an active area defined by a cell element isolation film. The device includes a cell area separation film defining the cell area in the substrate, the dummy cell area defining a boundary with the cell area separation film between the normal cell area and the cell area separation film. The device includes a normal bit-line on the normal cell area and extending in a first direction, a dummy bit-line group on the dummy cell area, the dummy bit-line group including a plurality of dummy bit-lines extending in the first direction, and a plurality of storage contacts connected to the active area and located along a second direction perpendicular to the first direction.

Abstract: A semiconductor memory device includes an electrode structure, a plurality of channel posts, and at least one gate separation layer. The electrode structure includes insulating interlayers and gate conductive layers which are alternately stacked. The channel posts are formed through the electrode structure. The gate separation layer is formed between the channel posts. The gate separation layer separates an uppermost gate conductive layer among the gate conductive layers. Each channel post among the channel posts adjacent to the gate separation layer has a gibbous moon shape in a planar view. The semiconductor memory device further includes a slit structure arranged at both sides of the gate separation layer. The slit structure is formed through the electrode structure. Each channel post among the channel posts adjacent to the slit structure has a gibbous moon shape in the planar view.

Abstract: Proposed is an artificial ankle joint bearing element in which a contact area of the bearing element with a talus element is increased such that stress is evenly distributed during bearing movement of the bearing element on the talus element and wear of the bearing element is reduced under the same load; the bearing element has a front and a rear convexly formed to increase a contact area with a tibial element and distribute stress; and the front and rear of the bearing element are asymmetrically formed such that the rear thereof is formed to have a smaller height than the front thereof so as to facilitate the insertion of the bearing element into space between the talus element and the tibial element from an anterior side thereof during artificial ankle joint surgery.

Abstract: A semiconductor device includes a plurality of first slits disposed at a boundary region of contiguous memory blocks isolating the memory blocks from each other, and disposed to be spaced apart from each other by a predetermined distance in a first direction; at least one word line disposed between the first slits disposed in a square shape; at least one drain selection line disposed over the word line; and a plurality of isolation patterns disposed to isolate each segment of the at least one drain selection line into units of a block. The at least one word line is integrated into a single structure.

Abstract: A display device includes first and second substrates each including a short side and a long side, ground parts located on at least one of the short and long sides of each of the first and second substrates and including at least one first ground surfaces, which are perpendicular to opposing surfaces of the first and second substrates, and at least one second ground surfaces, which are provided at at least one edge of the second substrate to define an obtuse angle with reference to the first ground surfaces, and unevenness disposed on the first ground surfaces along a first direction, where the unevenness defines an acute angle with reference to a normal line to the opposing surfaces.

Abstract: A semiconductor device is disclosed. The semiconductor device includes a first slit, at least one word line, and a second slit. The first slit is disposed at a boundary between contiguous memory blocks to isolate the memory blocks from each other, and includes a first outer slit and a second outer slit, the second outer slit is spaced apart in a first direction from the first outer slit by a predetermined distance. The word line is disposed, between the first and second outer slits, including a center region having a first end and a second end, and an edge region located at the first end and a second end of the center region, and the second slit is disposed at the center region that isolate area of the word line in the center region on either side of the second slit, wherein the word line is continuous in the edge regions.

Abstract: A display device includes first and second substrates each including a short side and a long side, ground parts located on at least one of the short and long sides of each of the first and second substrates and including at least one first ground surfaces, which are perpendicular to opposing surfaces of the first and second substrates, and at least one second ground surfaces, which are provided at at least one edge of the second substrate to define an obtuse angle with reference to the first ground surfaces, and unevenness disposed on the first ground surfaces along a first direction, where the unevenness defines an acute angle with reference to a normal line to the opposing surfaces.

Abstract: A semiconductor manufacturing apparatus includes a loadlock module including a loadlock chamber in which a substrate container is received, wherein the loadlock module is configured to switch an internal pressure of the loadlock chamber between atmospheric pressure and a vacuum; and a transfer module configured to transfer a substrate between the substrate container received in the loadlock chamber and a process module for performing a semiconductor manufacturing process on the substrate, wherein the loadlock module includes a purge gas supply unit configured to supply a purge gas into the substrate container through a gas supply line connected to the substrate container; and an exhaust unit configured to discharge a gas in the substrate container through an exhaust line connected to the substrate container.

Abstract: A semiconductor memory device includes an electrode structure including a plurality of gate conductive films stacked on a substrate and a channel array in which a plurality of channel columns passing through the electrode structure are arranged in a second direction. The plurality of channel columns may include a first column whose uppermost plane has a first shape and a second column whose uppermost plane has a second shape. N (N is a natural number equal to more than 1) first columns and N second columns are alternately arranged in a first direction different from the second direction.