Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: An optical system affixed to an electronic apparatus is provided, including a first optical module, a second optical module, and a third optical module. The first optical module is configured to adjust the moving direction of a first light from a first moving direction to a second moving direction, wherein the first moving direction is not parallel to the second moving direction. The second optical module is configured to receive the first light moving in the second moving direction. The first light reaches the third optical module via the first optical module and the second optical module in sequence. The third optical module includes a first photoelectric converter configured to transform the first light into a first image signal.

Abstract: A memory device includes a memory array that comprises at least a bit cell configured to store a data bit; a tracking circuit, coupled to the memory array, and configured to provide an enable signal in response to a first timing edge of a clock signal, wherein the enable signal emulates an electrical signal path propagating the memory array; and a control logic circuit comprising a timing control engine coupled to the tracking circuit, wherein the timing control engine is configured to select a faster timing edge between a second timing edge of the clock signal and a third timing edge of the enable signal so as to terminate an ongoing operation of the bit cell.

Abstract: A memory device includes a memory array that comprises at least a bit cell configured to store a data bit; a tracking circuit, coupled to the memory array, and configured to provide an enable signal in response to a first timing edge of a clock signal, wherein the enable signal emulates an electrical signal path propagating the memory array; and a control logic circuit comprising a timing control engine coupled to the tracking circuit, wherein the timing control engine is configured to select a faster timing edge between a second timing edge of the clock signal and a third timing edge of the enable signal so as to terminate an ongoing operation of the bit cell.

Abstract: A method for forming an integrated circuit includes forming a deep n-well (DNW) in a substrate, and forming a PMOS transistor in the DNW. The method also includes forming an NMOS transistor in the substrate and outside the DNW, and forming a reverse-biased diode. The method further includes forming an electrical path between a drain of the PMOS transistor and a gate structure of the NMOS transistor. The dissipation device is also connected to the electrical path.

Abstract: A circuit includes a fuse cell, a sense circuit and an output control circuit. The fuse cell includes an electrical fuse. The sense circuit is electrically coupled to the fuse cell and configured for generating a sense signal indicative of a programmed condition of the electrical fuse, at an output of the sense circuit. The output control circuit is electrically coupled to the output of the sense circuit, and the output control circuit is configured for latching the sense signal indicative of the electrical fuse having been programmed, during a read operation of the fuse cell.

Abstract: A method for forming an integrated circuit includes forming a deep n-well (DNW) in a substrate, and forming a PMOS transistor in the DNW. The method also includes forming an NMOS transistor in the substrate and outside the DNW, and forming a reverse-biased diode. The method further includes forming an electrical path between a drain of the PMOS transistor and a gate structure of the NMOS transistor. The dissipation device is also connected to the electrical path.

Abstract: A method for forming an integrated circuit includes forming a deep n-well (DNW) in a substrate, and forming a PMOS transistor in the DNW. The method also includes forming an NMOS transistor in the substrate and outside the DNW, and forming a reverse-biased diode. The method further includes forming an electrical path between a drain of the PMOS transistor and a gate structure of the NMOS transistor. The dissipation device is also connected to the electrical path.

Abstract: A circuit comprises a first transistor, a capacitive component, a second transistor, and a data line. The first transistor has a threshold voltage value. A first terminal of the first transistor is coupled with a first terminal of the capacitive component and a second terminal of the second transistor. A second terminal of the first transistor is configured to receive a second-terminal voltage value. A third terminal of the first transistor is configured to receive a third-terminal voltage value. A first terminal of the second transistor is coupled with the data line. A third terminal of the second transistor is configured to receive a second-transistor control signal. The first transistor is configured to be on and off to maintain the data line at a data line voltage value.

Abstract: A method includes reading data from a subset of a plurality of memory bit cells of a non-volatile memory. The data identifies an address of at least one individual failed bit cell. The method further includes loading the data directly into a register, receiving an address of data to be accessed, determining if the received address is the address of any individual failed bit cell; and accessing the data of the register if the received address is the address of any individual failed bit cell.

Abstract: A method includes, by a first circuit, converting a plurality of bits in a first format to a second format. The plurality of bits in the second format is used, by a second circuit, to program a plurality of memory cells corresponding to the plurality of bits. The first format is a parallel format. The second format is a serial format. The first circuit and the second circuit are electrically coupled together in a chip. In some embodiments, the plurality of bits includes address information, cell data information, and program information of a memory cell that has an error. In some embodiments, the plurality of bits includes word data information of a word and error code and correction information corresponding to the word data information of the word.

Abstract: In a method, a current value of a memory cell of a tracked circuit is determined. The memory cell is coupled with a data line. A tracking current value of a tracking memory cell of a tracking circuit is determined. The tracking memory cell is coupled with a tracking data line. A current value of a transistor of the tracking circuit is determined, based on a current value of a transistor of the tracked circuit, the current value of the memory cell, and the tracking current value of the tracking memory cell. A signal of the tracked circuit is generated based on a signal of the tracking circuit.

Abstract: A circuit comprises a first transistor, a capacitive component, a second transistor, and a data line. The first transistor has a threshold voltage value. A first terminal of the first transistor is coupled with a first terminal of the capacitive component and a second terminal of the second transistor. A second terminal of the first transistor is configured to receive a second-terminal voltage value. A third terminal of the first transistor is configured to receive a third-terminal voltage value. A first terminal of the second transistor is coupled with the data line. A third terminal of the second transistor is configured to receive a second-transistor control signal. The first transistor is configured to be on and off to maintain the data line at a data line voltage value.

Abstract: In a method, a current value of a memory cell of a tracked circuit is determined. The memory cell is coupled with a data line. A tracking current value of a tracking memory cell of a tracking circuit is determined. The tracking memory cell is coupled with a tracking data line. A current value of a transistor of the tracking circuit is determined, based on a current value of a transistor of the tracked circuit, the current value of the memory cell, and the tracking current value of the tracking memory cell. A signal of the tracked circuit is generated based on a signal of the tracking circuit.

Abstract: A method for forming an integrated circuit includes forming a deep n-well (DNW) in a substrate, and forming a PMOS transistor in the DNW. The method also includes forming an NMOS transistor in the substrate and outside the DNW, and forming a reverse-biased diode. The method further includes forming an electrical path between a drain of the PMOS transistor and a gate structure of the NMOS transistor. The dissipation device is also connected to the electrical path.

Abstract: During various processing operations, ions from process plasma may be transfer to a deep n-well (DNW) formed under devices structures. A reverse-biased diode may be connected to the signal line to protect a gate dielectric formed outside the DNW and is connected to the drain of the transistor formed inside the DNW.

Abstract: A circuit includes a fuse cell, a sense circuit and an output control circuit. The fuse cell includes an electrical fuse. The sense circuit is electrically coupled to the fuse cell and configured for generating a sense signal indicative of a programmed condition of the electrical fuse, at an output of the sense circuit. The output control circuit is electrically coupled to the output of the sense circuit, and the output control circuit is configured for latching the sense signal indicative of the electrical fuse having been programmed, during a read operation of the fuse cell.

Abstract: The embodiments of methods and structures disclosed herein provide mechanisms of forming and programming a metal-via fuse. The metal-via fuse and a programming transistor form a one-time programmable (OTP) memory cell. The metal-via fuse has a high resistance and can be programmed with a low programming voltage, which expands the programming window.

Abstract: A method of reading an eFuse in a column of eFuse memory cells includes electrically disconnecting a first end of the eFuse from a first electrical path. A second electrical path between a second end of the eFuse and a node is activated to bypass a third electrical path, where the third electrical path includes a diode device between the second end of the eFuse and the node. A footer coupled with the node is turned on.

Abstract: A word line driver including a control switch configured to receive a control signal, where the control switch is between a first node configured to receive an operating voltage signal and a second node configured to determine an output of the word line driver. The word line driver further includes a cross-coupled amplifier electrically connected to the second node. The word line driver further includes at least one inverter electrically connected to the cross-coupled amplifier. A semiconductor device including the word line driver and a memory array including at least one electronic fuse.