Abstract: A display apparatus includes a display panel, an afterimage compensator and a data driver. The display panel displays an image. The afterimage compensator writes first stress data of input image data corresponding to a first area to a first memory area in a first block size and second stress data of the input image data corresponding to a second area to a second memory area in a second block size different from the first block size and compensates a grayscale value of the input image data based on the first stress data and the second stress data. The data driver generates a data voltage based on a compensated grayscale value and outputs the data voltage to the display panel.

Abstract: A substrate processing apparatus is provided. The substrate processing apparatus includes a chamber comprising a support, the support configured to have mounted thereon a substrate; at least one channel disposed in the chamber and into which a conductive fluid or a non-conductive fluid is configured to be injected; and a control unit. The control unit includes a first pump and a second pump configured to respectively supply the conductive fluid and the non-conductive fluid to the at least one channel; and a first valve configured to receive the conductive fluid and the non-conductive fluid from the first pump and the second pump, respectively, and control proportions at which the conductive fluid and the non-conductive fluid are injected into the at least one channel.

Abstract: A display apparatus includes a blue light emitting element configured to emit blue light; a red light emitting element configured to emit red light; and a green light emitting element configured to emit green light. The blue light emitting element may include a first light emitting diode configured to emit light having a maximum intensity at a wavelength shorter than a blue wavelength; and a blue filter configured to transmit light having the blue wavelength.

Abstract: A plasma treatment apparatus includes a light generator that generates light, a chamber that receives the light generated from the light generator, an optical element provided between the light generator and the chamber, a light detector that detects the light reflected in the chamber, and a controller connected to the light generator and the light detector. The chamber includes an electrostatic chuck provided in a lower portion of the chamber, an edge ring provided around the electrostatic chuck, an outer wall for sealing an inner space of the chamber, and a gas supply that injects a process gas into the chamber. The optical element branches the generated light to irradiate branched light to different regions of the chamber.

Abstract: The present invention relates to a polyester resin for an adhesive strength-improved binder and a polyester fiber using the same, in which adhesive properties of the polyester resin for the adhesive strength-improved binder are not lowered at high temperatures since melt viscosity even at high temperatures of the polyester resin for the adhesive strength-improved binder, as a polyester resin for a binder, the polyester resin including terephthalic acid or an ester-forming derivative thereof as an acid component and including 2-methyl-1,3-propanediol, 2-methyl-1,3-pentanediol, and ethylene glycol as diol components, is not greatly lowered.

Abstract: According to an aspect disclosed, there is provided a display apparatus and a manufacturing method capable of maintaining color conversion efficiency and simultaneously expanding a color gamut by emitting light of two wavelengths to one light source. A display apparatus includes a light source configured to emit signal light having a first peak center wavelength and excitation light having a second peak center wavelength shorter than the first peak center wavelength; and a converter configured to convert color of the excitation light emitted by the light source. The light source may be configured to include at least one single chip in which a first semiconductor layer emitting the excitation light and a second semiconductor layer emitting the signal light are arranged in a horizontal or vertical direction.

Abstract: In a method of testing an interconnection substrate, a blocking condition of a reference light reflected from a probe having an intrinsic optical characteristic may be set. An electric field emitted from a test interconnection substrate having a plurality of circuits may change the intrinsic optical characteristics of the probe into test optical characteristics. Light may be irradiated to the probe having the test optical characteristics. The reference light reflected from the probe having the test optical characteristic may be blocked in accordance with the blocking condition. The remaining reflected light that may be due to an abnormal circuit may be detected.

Abstract: An apparatus for testing a wiring circuit includes: a circuit substrate having wirings in the circuit substrate and pads on an upper surface of the circuit substrate and connected to the wirings; an electrode below a lower surface of the circuit substrate; an optical sensor above the upper surface of the circuit substrate and configured to detect a signal emitted from the upper surface of the circuit substrate; and an optical unit above the optical sensor and configured to irradiate light, wherein the optical sensor includes: an optical substrate whose optical characteristics are changed by the signal emitted from the upper surface of the circuit substrate; and a patterned reflective layer on a surface of the optical substrate facing the circuit substrate, the patterned reflective layer having a first region reflecting light incident on the optical substrate and a second region transmitting the light incident on the optical substrate.

Abstract: The present invention relates to a nonwoven fabric for cabin air filter including a low melting point polyester fiber, in which the nonwoven fabric for cabin air filter includes a first polyester fiber containing a polyester resin having a melting point higher than 250° C. and a second polyester fiber containing a low melting point polyester resin having a softening point of 100 to 150° C., the first polyester fiber is a modified cross-sectional yarn having a roundness of 50 to 80%, the second polyester fiber includes a low melting point polyester resin which is formed from an acid component included of terephthalic acid or ester-forming derivatives thereof, and a diol component included of 2-methyl-1,3-propanediol, 2-methyl-1,3-pentanediol, and ethylene glycol, and the second polyester fiber contains illite particles, i.e., micaceous mineral, or a mixture of the illite particles and sericite particles, and silver-based inorganic antibacterial agent particles.

Abstract: An interconnect circuit testing apparatus including: an electric signal generating circuit for generating an electric signal; a first electrode arranged at a first region of a substrate, wherein the substrate includes an interconnect circuit, an upper surface and a lower surface; a second electrode arranged at a second region of the substrate; and a sensor for detecting an electric field emitted from the first region or the second region when the electric signal is applied to the substrate through the first electrode and the second electrode.

Abstract: A sound-absorbing air duct for a vehicle includes a lower non-woven fabric and an upper non-woven fabric sandwiching wires therebetween; and a film made of a polyester resin having a low melting point and disposed on the upper non-woven fabric, wherein each of the lower and upper non-woven fabrics includes a mixture between a first polyester fiber containing a polyester resin having a melting point higher than 250° C. and a second polyester fiber containing a polyester resin having a low melting point and having a softening point of 100° C. to 150° C., wherein the second polyester fiber includes a polyester resin having a low melting point composed of: an acid component including terephthalic acid or an ester-forming derivative thereof; and a diol component including 2-methyl-1,3-propanediol, 2-methyl-1,3-pentanediol, and ethylene glycol.

Abstract: A semiconductor device including a signal generator and decoding and timing skew adjusting circuit is provided. The signal generator is configured to receive n multi-level signals having m signal levels and convert the n multi-level signals into n*(m?1) single level signals having two signal levels. The decoding and timing skew adjusting circuit is configured to receive the single level signals, perform a predefined operation on the single level signals to generate an output signal, and compensate for timing skew between the n multi-level signals, using the single level signals. The n and m are natural numbers, where n>=2 and m>=3.

Abstract: A clutch control apparatus includes: a judder extractor for extracting a judder component based on a speed of a transmission input shaft; an anti-judder signal generator for generating a basic control signal, which is a reverse phase signal to the judder component, based on the judder component extracted by the judder extractor; a signal separator for separating an amplitude and a phase of the basic control signal received from the anti-judder signal generator; and a signal post-processing device for respectively adjusting the amplitude and the phase output from the signal separator and then combining the same together to output anti-judder torque.

Abstract: A display apparatus includes a blue light emitting element configured to emit blue light; a red light emitting element configured to emit red light; and a green light emitting element configured to emit green light. The blue light emitting element may include a first light emitting diode configured to emit light having a maximum intensity at a wavelength shorter than a blue wavelength; and a blue filter configured to transmit light having the blue wavelength.

Abstract: Provided are a wafer probe card that matches in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and inspects brightness and wavelength of light emitted from a plurality of LEDs provided on the LED wafer at once by controlling the plurality of LEDs to emit light, an analysis apparatus including the same, and a method of fabricating the wafer probe card.

Abstract: A light emitting diode (LED) apparatus is provided. The LED apparatus includes a light emitting diode, a light conversion layer stacked on the light emitting diode and configured to convert a wavelength of light incident from the light emitting diode, a reflection coating layer stacked on the light conversion layer and configured to pass the light of which the wavelength is converted in light incident from the light conversion layer therethrough and reflecting the other light, and a color filter stacked on the reflection coating layer and configured to correspond to the light conversion layer.

Abstract: A display apparatus is provided. The display apparatus includes: a display configured to include a plurality of display modules, a storage configured to store a first luminance correction coefficient corresponding to light-emitting pixels constituting each of the plurality of display modules and a second luminance correction coefficient corresponding to at least one target pixels adjacent to a seam region from among the light-emitting pixels, and a processor configured to apply the second luminance correction coefficient to the target pixel, apply the first luminance correction coefficient to remaining pixels, and drive the display, wherein the second luminance correction coefficient may be a luminance correction coefficient which is calculated based on a target luminance value to compensate the seam region.

Abstract: A multiview image display apparatus is provided. The multiview image display apparatus includes a depth adjuster configured to adjust a depth of an input image, a renderer configured to perform rendering on multiview images based on the depth-adjusted image, a crosstalk compensator configured to perform crosstalk inverse compensation on the rendered multiview images, a display configured to arrange the crosstalk inverse compensated multiview images in a preset arrangement pattern and display the crosstalk inverse compensated multiview images arranged in the preset arrangement pattern, and a controller configured to estimate crosstalk, and control the depth adjuster to adjust a depth value of a region that satisfies a preset condition to a preset depth value based on the estimated crosstalk.

Abstract: In a method of testing an interconnection substrate, a blocking condition of a reference light reflected from a probe having an intrinsic optical characteristic may be set. An electric field emitted from a test interconnection substrate having a plurality of circuits may change the intrinsic optical characteristics of the probe into test optical characteristics. Light may be irradiated to the probe having the test optical characteristics. The reference light reflected from the probe having the test optical characteristic may be blocked in accordance with the blocking condition. The remaining reflected light that may be due to an abnormal circuit may be detected.

Abstract: An apparatus for testing a wiring circuit includes: a circuit substrate having wirings in the circuit substrate and pads on an upper surface of the circuit substrate and connected to the wirings; an electrode below a lower surface of the circuit substrate; an optical sensor above the upper surface of the circuit substrate and configured to detect a signal emitted from the upper surface of the circuit substrate; and an optical unit above the optical sensor and configured to irradiate light, wherein the optical sensor includes: an optical substrate whose optical characteristics are changed by the signal emitted from the upper surface of the circuit substrate; and a patterned reflective layer on a surface of the optical substrate facing the circuit substrate, the patterned reflective layer having a first region reflecting light incident on the optical substrate and a second region transmitting the light incident on the optical substrate.