Patents by Inventor Sunil Konanki

Sunil Konanki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for circuit noise analysis
    Patent number: 7444600
    Abstract: Systems and methods for the noise analysis of circuits are presented. These systems and methods may allow a circuit or circuit design to be analyzed for possible noise failures in a block of logic caused by sources. outside the block. More particularly, these systems and methods may generate an abstract file for one or more blocks of a circuit. These abstract files may include noise tolerances for input pins and bi-directional pins of a block, along with noise tolerances for those output pins of the block which also feed to an input of one or more gates internal to the block. Using these noise abstracts a unit of the circuit may be analyzed, or the circuit itself may be analyzed for possible noise induced failures.
    Type: Grant
    Filed: August 17, 2005
    Date of Patent: October 28, 2008
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Atsushi Kameyama, Sunil Konanki, Michael Henry Sitko
  • System and method for circuit noise analysis
    Publication number: 20070044048
    Abstract: Systems and methods for the noise analysis of circuits are presented. These systems and methods may allow a circuit or circuit design to be analyzed for possible noise failures in a block of logic caused by sources. outside the block. More particularly, these systems and methods may generate an abstract file for one or more blocks of a circuit. These abstract files may include noise tolerances for input pins and bi-directional pins of a block, along with noise tolerances for those output pins of the block which also feed to an input of one or more gates internal to the block. Using these noise abstracts a unit of the circuit may be analyzed, or the circuit itself may be analyzed for possible noise induced failures.
    Type: Application
    Filed: August 17, 2005
    Publication date: February 22, 2007
    Inventors: Atsushi Kameyama, Sunil Konanki, Michael Sitko