Patents by Inventor Sunil Narayan Shabde

Sunil Narayan Shabde has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors
    Patent number: 6348356
    Abstract: Method for determining the robustness of a device to soft errors generated by alpha-particle and/or cosmic ray strikes.
    Type: Grant
    Filed: September 19, 2000
    Date of Patent: February 19, 2002
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Sunil Narayan Shabde, Richard C. Blish, II, Donald L. Wollesen
  • Method and apparatus for determining the robustness and incident angle sensitivity of memory cells to alpha-particle/cosmic ray induced soft errors
    Patent number: 6211692
    Abstract: Apparatus and methods for determining the robustness and angle sensitivity of a device to soft errors generated by alpha-particle and/or cosmic ray strikes. In one embodiment, the method includes the steps of producing a light pulse with a given light pulse energy; applying the light pulse to the device at a predetermined location and a predetermined angle; varying the light pulse energy; and detecting soft errors in the device.
    Type: Grant
    Filed: September 30, 1998
    Date of Patent: April 3, 2001
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Sunil Narayan Shabde, Yowjuang W. Liu
  • Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors
    Patent number: 6204516
    Abstract: Apparatus and methods for determining the robustness of a device to soft errors generated by alpha-particle and/or cosmic ray strikes.
    Type: Grant
    Filed: September 30, 1998
    Date of Patent: March 20, 2001
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Sunil Narayan Shabde, Richard C. Blish, II, Donald L. Wollesen
  • Method and apparatus for determining the robustness of memory cells to alpha-particle/cosmic ray induced soft errors
    Patent number: 5999465
    Abstract: Apparatus and methods for determining the robustness of a device to soft errors generated by alpha-particle and/or cosmic ray strikes. In one embodiment, the method includes the steps of producing a light pulse having a light pulse energy, applying the light pulse to the device at a predetermined location, varying the light pulse energy, and detecting soft errors in the device. In another embodiment, the apparatus includes a light source for producing a light pulse that is applied to the device at a predetermined location, a light pulse energy varying circuit coupled to the light source and configured to vary the light energy of the light pulse, and a detecting circuit coupled to the device and configured to detecting soft errors in the device.
    Type: Grant
    Filed: September 30, 1998
    Date of Patent: December 7, 1999
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Sunil Narayan Shabde, Yowjuang W. Liu, Donald L. Wollesen
  • Method and apparatus for determining the robustness of memory cells to induced soft errors using equivalent diodes
    Patent number: 5982691
    Abstract: Apparatus and methods for determining the robustness of a device to soft errors generated by alpha-particle and/or cosmic ray strikes by measuring the charge Q.sub.c that flow through a node of an equivalent diode structure when the diode structure is impinged by a light pulse with energy equivalent to that of the alpha-particle and/or cosmic ray strikes. In one embodiment, the method includes the steps of producing a light pulse having a light pulse energy, the light pulse energy is at a first light pulse energy; applying the light pulse to the device at a predetermined location, the predetermined location having an area and a geometry; varying the light pulse energy to a second light pulse energy which generates a soft error; detecting soft errors in the device; providing a diode having the same area and geometry as the predetermined location; applying the light pulse with the second light pulse energy to the diode; and determining the amount of charges that flow through the diode.
    Type: Grant
    Filed: September 30, 1998
    Date of Patent: November 9, 1999
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Sunil Narayan Shabde, Donald L. Wollesen