Patents by Inventor Sunil Shabde

Sunil Shabde has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test system and methodology to improve stacked NAND gate based critical path performance and reliability
    Patent number: 6216099
    Abstract: A test system and methodology to improve the performance and reliability of critical paths including stacked NAND gates with sub-minimum channel transistors employs one or more inverter based ring oscillators to generate reliability data. The reliability data is used to calibrate an aged transistor model, which describes the hot carrier reliability of sub-minimum channel length transistors. A computer simulation uses the calibrated, aged transistor model to simulate the critical path circuitry including the stacked NAND gates.
    Type: Grant
    Filed: September 5, 1997
    Date of Patent: April 10, 2001
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Peng Fang, Sunil Shabde