Abstract: A computer system automatically determines and displays the physical location of a failed memory cell of an array of memory cells on magnified images of a memory IC (integrated circuit) die from label information of the failed memory cell generated by a test station. The label information includes any combination of a sector label, an I/O label, a column label, and a row label. The memory IC die is comprised of a plurality of sectors, and the sector label corresponds to the sector having the failed memory cell located therein. A sector is comprised of a plurality of I/O regions, and the I/O label specifies the I/O region having the failed memory cell located therein, within the sector having the sector label. An I/O region is comprised of a plurality of horizontal conductive structures and vertical conductive structures.