Abstract: An operational amplifier includes a pre-amplifier circuit, a first trim circuit, and a second trim circuit. The pre-amplifier circuit is to include a differential pair and receive an input voltage. The first trim circuit is to produce an offset voltage correction current and provide the offset voltage correction current to the pre-amplifier circuit to correct an offset of the operational amplifier. The second trim circuit is to produce a common mode voltage (VCM) correction current, provide the VCM voltage correction current to the pre-amplifier circuit, and cause the VCM correction current to have a non-zero value to reduce a correction caused by the offset voltage correction current when the input voltage is within a mid voltage input range. The pre-amplifier circuit is to apply the offset correction current and the VCM correction current to output signals of the differential pair.

Abstract: Over-voltage tolerant circuits and methods are provided. In one embodiment, the circuit includes a pull-up transistor coupled to an I/O pad, a sensing circuit coupled to the I/O pad and to a voltage supply (Vcc), the sensing circuit configured to sense a voltage applied to the pad (Vpad), a latch coupled to the sensing circuit to retain an output of the sensing circuit, and a selection circuit coupled to the sensing circuit through the latch. The selection circuit includes a first bias circuit to apply Vcc to a well and gate of the pull-up transistor, a second bias circuit to apply Vpad to the gate and the well of the pull-up transistor, and a non-overlap circuit configured to ensure the gate and the well of the pull-up transistor is substantially always driven by either the first or the second bias circuit depending on the output of the sensing circuit.

Abstract: Over-voltage tolerant circuits and methods are provided. In one embodiment, the circuit includes a pull-up transistor coupled to an I/O pad, a sensing circuit coupled to the I/O pad and to a voltage supply (Vcc), the sensing circuit configured to sense a voltage applied to the pad (Vpad), a latch coupled to the sensing circuit to retain an output of the sensing circuit, and a selection circuit coupled to the sensing circuit through the latch. The selection circuit includes a first bias circuit to apply Vcc to a well and gate of the pull-up transistor, a second bias circuit to apply Vpad to the gate and the well of the pull-up transistor, and a non-overlap circuit configured to ensure the gate and the well of the pull-up transistor is substantially always driven by either the first or the second bias circuit depending on the output of the sensing circuit.