Abstract: A system and method are disclosed for capturing pre- and post-event data for random events using minimum power. Real-time data is captured and stored in a continuous loop in a segment of a first memory. Upon detection of a designated event, a second memory is powered-on and post-event data is stored to a segment of the second memory. After a designated data capture window, the second memory is powered-off and real-time data is captured in an unused segment of the first memory. The post-event data may be captured in the unused segment of the first memory and later transferred to the second memory. Auto-address logic monitors and controls the storage and retrieval of pre- and post-event in the first and second memory. An energy management system determines and controls which segments of the first and second memory should be powered-on or kept in the stasis mode to store event data.

Abstract: A system and method are disclosed for capturing pre- and post-event data for random events using minimum power. Real-time data is captured and stored in a continuous loop in a segment of a first memory. Upon detection of a designated event, a second memory is powered-on and post-event data is stored to a segment of the second memory. After a designated data capture window, the second memory is powered-off and real-time data is captured in an unused segment of the first memory. The post-event data may be captured in the unused segment of the first memory and later transferred to the second memory. Auto-address logic monitors and controls the storage and retrieval of pre- and post-event in the first and second memory. An energy management system determines and controls which segments of the first and second memory should be powered-on or kept in the stasis mode to store event data.

Abstract: A deglitch circuit utilizes a first flip-flop coupled to the input signal and a second flip-flop coupled to the output of a circuit with feedback from the output to gates to control first and second inputs to the first flip-flop. In an alternative arrangement, a counter is provided between the output of the first flip-flop and the input to the second flip-flop in order to provide flexibility and the possibility of a longer delay for the circuit.

Abstract: A programmable voltage regulator configurable for reverse blocking and double power density is disclosed herein. The programmable voltage regulator includes an error amplifier that couples to receive a reference voltage. A first NMOS pass transistor connects between an auxiliary voltage input node and the output terminal of the voltage regulator, wherein the first NMOS pass transistor is biased by the output of the error amplifier. Connected between the source of the first NMOS pass transistor and the second input of the error amplifier, a feedback network provides feedback for the voltage regulator. A second NMOS pass transistor connects between the first power supply and the auxiliary voltage input node. Furthermore, an independent node control circuit biases the second NMOS pass transistor such that in a first mode of operation, a first control signal input is operable to receive a signal for controlling the second NMOS pass transistor during reverse battery condition.

Abstract: A FET switching transistor for the solenoid coil of an ABS braking system can switched ON or OFF in no more than substantially 250 ns. A higher current biasing circuit for fast turn on of the FET switching transistor is disconnected when it is necessary to limit the current flowing therethrough, whether during the inrush current to the solenoid coil or due to a fault in the system. The high speed switching of the FET switching transistor causes ringing of the current through the transistor which causes the current detector circuit to exit the current control mode. A deglitch circuit prevents the current detector from exiting the current control mode, so that a timer can be used to turn off the FET switching transistor before it can be damaged by the heat generated during current limit operation.

Abstract: The present invention provides a system for stress testing an oxide structure to determine that structure's reliability in overstress conditions. The present invention provides an overstress test structure (400) that comprises a first transistor (406), having a first terminal coupled to ground, a second terminal coupled to a control signal (402), and a third terminal coupled to a first end of a first resistive element (412). A first voltage source (414) is coupled to the second end of the first resistive element. A second resistive element (416) is intercoupled between the second end of the first resistive element and ground. A second transistor (418) has a first terminal coupled to the second end of the first resistive element, a second terminal coupled to the first end of the first resistive element, and a third terminal coupled to a first node (420).

Abstract: A system and method is provided to view an anatomical structure such as a blood vessel in high contrast with its surrounding tissue. The system and method may be used to produce an image of an anatomical structure using reflected electromagnetic radiation singularly scattered from target tissue. The system and method may also provide same-side illumination and detection of reflected electromagnetic radiation in a convenient integral imaging device. The system and method may also provide helmet mounted imaging technology in a single integral helmet which allows the wearer to view an anatomical structure located within a patient such that the image is continuously oriented according to the orientation of the helmet wearer's head. The system and method may also be used in the performance of venipuncture. The system and method may provide for improved contrast between any anatomical structure and its surrounding tissue for use in any imaging system.