Abstract: A design structure embodied in a machine readable medium used in a design process, the design structure including a system for dynamically varying the pipeline depth of a computing device, depending upon at least one of computing function and workload, the system further comprising a state machine configured to determine an optimum length of a pipeline architecture based on a processing function to be performed; a pipeline sequence controller, responsive to the state machine, the pipeline sequence controller configured to vary the depth of the pipeline based on the determined optimum length; and a plurality of clock splitter elements, each associated with a corresponding plurality of latch stages in the pipeline architecture, the clock splitter elements coupled to the pipeline sequence controller and adapted to operate in a functional mode, one or more clock gating modes, and a pass-through flush mode; wherein, for each of the clock splitter elements operating in the pass-through flush mode, data is passed th

Abstract: A method and system of modeling power leakage for a design comprises providing one or more cell libraries comprising parameters for particular device characteristics and providing a module configured to determine of cell leakages of a device for a PVT corner. In determining the cell leakage, the module uses the device characteristics contained in the one or more cell libraries, in combination with one or more components at a PVT for a predetermined application and an amount of devices in a leakage path (Fckt) and a leakage distribution (Fchip). There is no need to recharacterize the one or more cell libraries.