Abstract: A broadband light source apparatus, and corresponding method, includes a broadband light source configured to provide broadband source light characterized by a source wavelength spectrum. The apparatus also includes a broadband optical filter including both a polarization changer with a length, as well as an exit polarizer. The broadband optical filter receives the source light and delivers broadband output light characterized by an output wavelength spectrum that is a function of the source wavelength spectrum and the polarization changer length and has an output centroid wavelength. The polarization changer length is configured to minimize a thermal sensitivity of the output centroid wavelength. The filter can be configured in view of a particular source wavelength spectrum to thermally stabilize the centroid wavelength and to maximize relative integrated output power passively with respect to ambient temperature fluctuations.

Abstract: A broadband light source apparatus, and corresponding method, includes a broadband light source configured to provide broadband source light characterized by a source wavelength spectrum. The apparatus also includes a broadband optical filter including both a polarization changer with a length, as well as an exit polarizer. The broadband optical filter receives the source light and delivers broadband output light characterized by an output wavelength spectrum that is a function of the source wavelength spectrum and the polarization changer length and has an output centroid wavelength. The polarization changer length is configured to minimize a thermal sensitivity of the output centroid wavelength. The filter can be configured in view of a particular source wavelength spectrum to thermally stabilize the centroid wavelength and to maximize relative integrated output power passively with respect to ambient temperature fluctuations.

Abstract: In an atom interferometer, improved results are obtained by configuring the interferometer to have a baseline fringe pattern, in combination with spatially resolved measurements at the interferometer ports. Two aspects of this idea are provided. In the first aspect, the atoms are configured to expand from an initial point-like spatial distribution. The result is an informative correlation between atom position and interferometer phase. In the second aspect, a phase shear is applied to the atom ensemble of an atom interferometer. In both cases, spatially resolved measurements at the interferometer ports can provide enhanced interferometer performance, such as single-shot operation.

Abstract: In an atom interferometer, improved results are obtained by configuring the interferometer to have a baseline fringe pattern, in combination with spatially resolved measurements at the interferometer ports. Two aspects of this idea are provided. In the first aspect, the atoms are configured to expand from an initial point-like spatial distribution. The result is an informative correlation between atom position and interferometer phase. In the second aspect, a phase shear is applied to the atom ensemble of an atom interferometer. In both cases, spatially resolved measurements at the interferometer ports can provide enhanced interferometer performance, such as single-shot operation.