Patents by Inventor Susumu Koshinuma

Susumu Koshinuma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor device and method of testing semiconductor device
    Patent number: 8648617
    Abstract: According to the following disclosure, disclosed is a semiconductor device including: an internal circuit configured to receive and output a signal current; a current mirror unit outputting a copied current corresponding to the signal current; and a test pad from which the copied current is taken out.
    Type: Grant
    Filed: February 7, 2011
    Date of Patent: February 11, 2014
    Assignee: Fujitsu Semiconductor Limited
    Inventors: Yuji Maruyama, Tatsuhiro Mizumasa, Takayuki Nakashiro, Shigeru Gotoh, Takayuki Yano, Susumu Koshinuma, Shunsuke Taniguchi, Yuki Yanagisako
  • Testing device for testing a semiconductor device
    Patent number: 8159250
    Abstract: A testing device of a semiconductor device includes a first board having a plurality of openings; a frame body provided in the openings, the frame body having a frame in which a plurality of probe needles is provided; and a plurality of second boards provided perpendicular to the first board in the periphery of the openings, the second boards being connected to the first board; wherein the probe needles pierce the frame so as to be connected to the second boards from the periphery of the frame body via the openings.
    Type: Grant
    Filed: July 10, 2009
    Date of Patent: April 17, 2012
    Assignee: Fujitsu Semiconductor Limited
    Inventors: Yuji Maruyama, Kazuhiro Tashiro, Kazuhiko Shimabayashi, Shigeru Goto, Takayuki Nakashiro, Susumu Koshinuma, Masayoshi Shirakawa
  • SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
    Publication number: 20110221466
    Abstract: According to the following disclosure, disclosed is a semiconductor device including: an internal circuit configured to receive and output a signal current; a current mirror unit outputting a copied current corresponding to the signal current; and a test pad from which the copied current is taken out.
    Type: Application
    Filed: February 7, 2011
    Publication date: September 15, 2011
    Applicant: FUJITSU SEMICONDUCTOR LIMITED
    Inventors: Yuji MARUYAMA, Tatsuhiro Mizumasa, Takayuki Nakashiro, Shigeru Gotoh, Takayuki Yano, Susumu Koshinuma, Shunsuke Taniguchi, Yuki Yanagisako
  • TESTING DEVICE OF SEMICONDUCTOR DEVICE
    Publication number: 20090267630
    Abstract: A testing device of a semiconductor device includes a first board having a plurality of openings; a frame body provided in the openings, the frame body having a frame in which a plurality of probe needles is provided; and a plurality of second boards provided perpendicular to the first board in the periphery of the openings, the second boards being connected to the first board; wherein the probe needles pierce the frame so as to be connected to the second boards from the periphery of the frame body via the openings.
    Type: Application
    Filed: July 10, 2009
    Publication date: October 29, 2009
    Applicant: FUJITSU MICROELECTRONICS LIMITED
    Inventors: Yuji Maruyama, Kazuhiro Tashiro, Kazuhiko Shimabayashi, Shigeru Goto, Takayuki Nakashiro, Susumu Koshinuma, Masayoshi Shirakawa