Patents by Inventor SUVADEEP BANERJEE

SUVADEEP BANERJEE has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11526648
    Abstract: Techniques are described for systematically and efficiently converting or otherwise accelerating latent defects in semiconductor devices into gross defects by applying appropriate defect acceleration stimulus to the semiconductor devices. Techniques are also described for evaluating test patterns to determine their effectiveness in accelerating the transition of latent defects to gross defects. This evaluation effectively allows various stress patterns to be graded or ranked, so that an optimal or high-confidence one can be selected. Such grading of possible stress patterns increases the probability that a given latent defect will escalate or otherwise manifest.
    Type: Grant
    Filed: March 22, 2019
    Date of Patent: December 13, 2022
    Assignee: Intel Corporation
    Inventors: Suriyaprakash Natarajan, Abhijit M. Sathaye, Suvadeep Banerjee
  • Publication number: 20220114270
    Abstract: Examples described herein relate to offload circuitry comprising one or more compute engines that are configurable to perform a workload offloaded from a process executed by a processor based on a descriptor particular to the workload. In some examples, the offload circuitry is configurable to perform the workload, among multiple different workloads. In some examples, the multiple different workloads include one or more of: data transformation (DT) for data format conversion, Locality Sensitive Hashing (LSH) for neural network (NN), similarity search, sparse general matrix-matrix multiplication (SpGEMM) acceleration of hash based sparse matrix multiplication, data encode, data decode, or embedding lookup.
    Type: Application
    Filed: December 22, 2021
    Publication date: April 14, 2022
    Inventors: Ren WANG, Sameh GOBRIEL, Somnath PAUL, Yipeng WANG, Priya AUTEE, Abhirupa LAYEK, Shaman NARAYANA, Edwin VERPLANKE, Mrittika GANGULI, Jr-Shian TSAI, Anton SOROKIN, Suvadeep BANERJEE, Abhijit DAVARE, Desmond KIRKPATRICK
  • Publication number: 20200302028
    Abstract: Techniques are described for systematically and efficiently converting or otherwise accelerating latent defects in semiconductor devices into gross defects by applying appropriate defect acceleration stimulus to the semiconductor devices. Techniques are also described for evaluating test patterns to determine their effectiveness in accelerating the transition of latent defects to gross defects. This evaluation effectively allows various stress patterns to be graded or ranked, so that an optimal or high-confidence one can be selected. Such grading of possible stress patterns increases the probability that a given latent defect will escalate or otherwise manifest.
    Type: Application
    Filed: March 22, 2019
    Publication date: September 24, 2020
    Applicant: INTEL CORPORATION
    Inventors: SURIYAPRAKASH NATARAJAN, ABHIJIT M. SATHAYE, SUVADEEP BANERJEE