Patents by Inventor Suzie Ghidei

Suzie Ghidei has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inline wafer defect detection system and method
    Patent number: 12230522
    Abstract: A wafer defect detection apparatus and a method of fabricating an IC using the same. Images of a plurality of semiconductor wafers forming a wafer lot are captured at a targeted process step of a fabrication flow and preprocessed, wherein a medoid image is identified as a reference wafer image. In one arrangement, preprocessed wafer images of a semiconductor wafer lot may be analyzed for defects based on an ensemble of image analysis techniques using at least one of the reference wafer image from the wafer lot and a template patch to enhance the predictive power of defect detection.
    Type: Grant
    Filed: December 30, 2021
    Date of Patent: February 18, 2025
    Assignee: Texas Instruments Incorporated
    Inventors: Patrick David Noll, Suzie Ghidei
  • INLINE WAFER DEFECT DETECTION SYSTEM AND METHOD
    Publication number: 20230072713
    Abstract: A wafer defect detection apparatus and a method of fabricating an IC using the same. Images of a plurality of semiconductor wafers forming a wafer lot are captured at a targeted process step of a fabrication flow and preprocessed, wherein a medoid image is identified as a reference wafer image. In one arrangement, preprocessed wafer images of a semiconductor wafer lot may be analyzed for defects based on an ensemble of image analysis techniques using at least one of the reference wafer image from the wafer lot and a template patch to enhance the predictive power of defect detection.
    Type: Application
    Filed: December 30, 2021
    Publication date: March 9, 2023
    Inventors: Patrick David Noll, Suzie Ghidei