Abstract: A measuring system is disclosed for measuring a physical parameter influencing a sensor element adapted to be connected to a measuring and control unit. The system comprises an information-carrying unit comprising a memory and being adapted to be associated with said measuring and control unit, said information-carrying unit being coordinated with the sensor element by containing stored information regarding the properties of the measuring system and the sensor element during measurements, and said information-carrying unit being supported by a connector for connecting said sensor element with said measuring and control unit.

Abstract: Compensation is provided for bending of an optical fiber in intensity-based optical measuring systems. A measuring signal and a reference signal of different wavelengths are generated and transmitted through an optical connection towards a sensor element. The reference signal is not influenced in the sensor element. The measuring and reference signals are detected and compensation is carried out for bending of the optical connection using correction data. The correction data is based upon pre-store data concerning the relationship between the measured reference signal and the measured measuring signal as a function of the bending influence on the optical connection. Devices and methods according to the invention allow for measurements with an optical pressure measuring system that exhibit effective compensation for any bending of the optical connection.

Abstract: The invention relates to a method for optical measuring systems, comprising a sensor element (6) connected to a measuring and control unit (10) via an optical connection (3), and being adapted for providing a signal defining a measurement of a physical parameter (p) influencing the sensor element (6), said method comprising generation of a measuring signal that is brought to come in towards the sensor element (6), and detection of the intensity of the measuring signal (B) in the measuring and control unit (10), after influencing the measuring signal in the sensor element (6).