Patents by Inventor Sven C. Fritz

Sven C. Fritz has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110307217
    Abstract: A method for analysis and assessment of measurement data of a measurement system having at least one measurement channel provides for the assessment of the measurement data at freely selectable times and over a freely selectable period on the basis of at least one of a plurality of predeterminable criteria. In order in this case to develop a central and generally applicable measurement data diagnosis, in which any desired number of measurement channels can be monitored at the same time with little effort and with good result representation, preferably with determination of the faulty channels, the raw data of the measurement channel is supplied to a fault isolation stage and then to a fault classification stage, and a measure is then determined for the quality of the measurement data of the respective measurement channel.
    Type: Application
    Filed: August 22, 2011
    Publication date: December 15, 2011
    Inventors: Sven C. Fritz, Thomas Guntschnig, Martin Stettner, Marvin Berger, Werner Fuchs
  • Publication number: 20090198474
    Abstract: A method for analysis and assessment of measurement data of a measurement system having at least one measurement channel provides for the assessment of the measurement data at freely selectable times and over a freely selectable period on the basis of at least one of a plurality of predeterminable criteria. In order in this case to develop a central and generally applicable measurement data diagnosis, in which any desired number of measurement channels can be monitored at the same time with little effort and with good result representation, preferably with determination of the faulty channels, the raw data of the measurement channel is supplied to a fault isolation stage and then to a fault classification stage, and a measure is then determined for the quality of the measurement data of the respective measurement channel.
    Type: Application
    Filed: January 14, 2009
    Publication date: August 6, 2009
    Inventors: Sven C. Fritz, Thomas Guntschnig, Martin Stettner, Marvin Berger, Werner Fuchs