Patents by Inventor Sven Molkenstruck

Sven Molkenstruck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230385479
    Abstract: A method of making a measurement relating to an object manufactured according to a model may be provided. The object may have a measured surface comprising a surface deviation relative to a corresponding surface of the model. The method may comprise obtaining measured surface data representing at least a portion of the measured surface comprising the said surface deviation. The method may comprise determining a measurement surface corresponding to the measured surface of the object by performing a statistical analysis of at least a portion of the measured surface data in respect of an interpretation direction such that a portion of the measured surface data is offset from the measurement surface in the interpretation direction. The method may comprise making a measurement relating to the object depending on the measurement surface.
    Type: Application
    Filed: October 13, 2020
    Publication date: November 30, 2023
    Inventors: Faisal Azhar, Stephen POLLARD, Sven Molkenstruck, Guy ADAMS
  • Publication number: 20230290060
    Abstract: A method is described in which a partial three-dimensional model of an object is constructed in dependence on abstract geometry data. The abstract geometry data is indicative of an incomplete description of the object. The abstract geometry data comprises an indication of at least one geometric shape of the object and a design parameter associated with the at least one geometric shape. The partial three-dimensional model is aligned with three-dimensional scan data of an instance of the object. Based on the alignment, the pose of the at least one geometric shape is identified in the three-dimensional scan data. The pose of the geometric shape and the associated design parameter are used to derive metrology data for the instance of the object from the three-dimensional scan data.
    Type: Application
    Filed: July 28, 2020
    Publication date: September 14, 2023
    Applicant: Hewlett-Packard Development Company, L.P.
    Inventors: Faisal Azhar, Markus Ernst Rilk, Sven Molkenstruck
  • Patent number: 10801834
    Abstract: A fringe projection method for determining the topography of a body (12) comprising the steps: projecting a series of sets of patterns (Ti) onto a surface (20) of the body (12), wherein each set has at least two patterns (Ti) and wherein each pattern (Ti) has S fringes; for each pattern (Ti), recording an image (24.i) of the surface (20) having the projected pattern, so that a sequence of recordings is formed; and calculating the topography from the images (24.i), wherein such patterns are projected in which each fringe has an intensity distribution perpendicular to the fringe longitudinal direction (L) and each intensity distribution can be expressed by a function (Q) which has a spatial phase position (?). According to the invention, the phase position (?) changes as a function of a code (g(s)) of the ordinal number (s) of the fringe.
    Type: Grant
    Filed: May 30, 2016
    Date of Patent: October 13, 2020
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Simon Winkelbach, Sven Molkenstruck, Markus Rilk
  • Publication number: 20180112975
    Abstract: A fringe projection method for determining the topography of a body (12) comprising the steps: projecting a series of sets of patterns (Ti) onto a surface (20) of the body (12), wherein each set has at least two patterns (Ti) and wherein each pattern (Ti) has S fringes; for each pattern (Ti), recording an image (24.i) of the surface (20) having the projected pattern, so that a sequence of recordings is formed; and calculating the topography from the images (24.i), wherein such patterns are projected in which each fringe has an intensity distribution perpendicular to the fringe longitudinal direction (L) and each intensity distribution can be expressed by a function (Q) which has a spatial phase position (ß). According to the invention, the phase position (ß) changes as a function of a code (g(s)) of the ordinal number (s) of the fringe.
    Type: Application
    Filed: May 30, 2016
    Publication date: April 26, 2018
    Inventors: Simon Winkelbach, Sven Molkenstruck, Markus Rilk