Patents by Inventor Swapnil Chaudhari

Swapnil Chaudhari has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11568173
    Abstract: A method of processing test execution logs to determine error location and source includes creating a set of training examples based on previously processed test execution logs, clustering the training examples into a set of clusters using an unsupervised learning process, and using training examples of each cluster to train a respective supervised learning process to label data where each generated cluster is used as a class/label to identify the type of errors in the test execution log. The labeled data is then processed by supervised learning processes, specifically a classification algorithm. Once the classification model is built it is used to predict the type of the errors in future/unseen test execution logs. In some embodiments, the unsupervised learning process is a density-based spatial clustering of applications with noise clustering application, and the supervised learning processes are random forest deep neural networks.
    Type: Grant
    Filed: June 4, 2020
    Date of Patent: January 31, 2023
    Assignee: Dell Products, L.P.
    Inventors: Malak Alshawabkeh, Motasem Awwad, Samer Badran, Swapnil Chaudhari
  • Publication number: 20210383170
    Abstract: A method of processing test execution logs to determine error location and source includes creating a set of training examples based on previously processed test execution logs, clustering the training examples into a set of clusters using an unsupervised learning process, and using training examples of each cluster to train a respective supervised learning process to label data where each generated cluster is used as a class/label to identify the type of errors in the test execution log. The labeled data is then processed by supervised learning processes, specifically a classification algorithm. Once the classification model is built it is used to predict the type of the errors in future/unseen test execution logs. In some embodiments, the unsupervised learning process is a density-based spatial clustering of applications with noise clustering application, and the supervised learning processes are random forest deep neural networks.
    Type: Application
    Filed: June 4, 2020
    Publication date: December 9, 2021
    Inventors: Malak Alshawabkeh, Motasem Awwad, Samer Badran, Swapnil Chaudhari