Patents by Inventor Swarupchandra Kamerkar

Swarupchandra Kamerkar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated circuit characterization based on measured and static apparent resistances
    Patent number: 8832634
    Abstract: First and second apparent resistance measures are determined for an integrated circuit and utilized to characterize the integrated circuit. The first apparent resistance measure is determined for the integrated circuit based on a first voltage drop and a first current that are measured using test equipment. The second apparent resistance measure is determined for the integrated circuit based on a second voltage drop and a second current that are obtained using static analysis of a corresponding integrated circuit design. The integrated circuit is characterized based on a comparison of the first and second apparent resistance measures. For example, characterizing the integrated circuit may comprise validating the static analysis of the integrated circuit design based on the comparison of the first and second apparent resistance measures, or determining a quality measure of the integrated circuit based on the comparison of the first and second apparent resistance measures.
    Type: Grant
    Filed: September 5, 2012
    Date of Patent: September 9, 2014
    Assignee: LSI Corporation
    Inventors: Suharli Tedja, Swarupchandra Kamerkar, Vineet Sreekumar, Yadvinder Singh
  • INTEGRATED CIRCUIT CHARACTERIZATION BASED ON MEASURED AND STATIC APPARENT RESISTANCES
    Publication number: 20140068532
    Abstract: First and second apparent resistance measures are determined for an integrated circuit and utilized to characterize the integrated circuit. The first apparent resistance measure is determined for the integrated circuit based on a first voltage drop and a first current that are measured using test equipment. The second apparent resistance measure is determined for the integrated circuit based on a second voltage drop and a second current that are obtained using static analysis of a corresponding integrated circuit design. The integrated circuit is characterized based on a comparison of the first and second apparent resistance measures. For example, characterizing the integrated circuit may comprise validating the static analysis of the integrated circuit design based on the comparison of the first and second apparent resistance measures, or determining a quality measure of the integrated circuit based on the comparison of the first and second apparent resistance measures.
    Type: Application
    Filed: September 5, 2012
    Publication date: March 6, 2014
    Applicant: LSI Corporation
    Inventors: Suharli Tedja, Swarupchandra Kamerkar, Vineet Sreekumar, Yadvinder Singh