Abstract: A method (300) for entering a character into an electronic device (100) is provided. The method (300) includes displaying (301) input character keys (204) on a touch sensitive region (202) of a display screen (105) of the device (100), the keys identifying an associated character. Next, a display step (309) shows at least one entered character in a display region (201) of the screen, the entered character having been selected by actuation of one of the character keys (204). Next, a group of potential subsequent characters that follow the entered character is predicted (311, 317). A second set of input character keys (205) identifying the potential subsequent characters is displayed (327). The second set of keys (205) are grouped together (323) such that their relative screen locations with respect to each other are different to that of corresponding keys in the first set of keys (204).

Abstract: A method and device for entering data enables intuitive and efficient displays of graphical user interfaces using three dimensional movements of a pointer (205). The method includes associating a first graphical user interface of an electronic device (100) with a first space (210) defined between a control surface such as a display screen (105) and a first plane (215) substantially parallel to the control surface. A second graphical user interface is associated with a second space (220) defined between the first plane (215) and a second plane (225) substantially parallel to the control surface. The second graphical user interface is then displayed on the display screen (105) of the electronic device (100) in response to detecting a location of the pointer (205) within the second space (220). Data are then entered into the electronic device (100) in response to a user interaction with the second graphical user interface.

Abstract: A method (300) for entering a character into an electronic device (100) is provided. The method (300) includes displaying (301) input character keys (204) on a touch sensitive region (202) of a display screen (105) of the device (100), the keys identifying an associated character. Next, a display step (309) shows at least one entered character in a display region (201) of the screen, the entered character having been selected by actuation of one of the character keys (204). Next, a group of potential subsequent characters that follow the entered character is predicted (311, 317). A second set of input character keys (205) identifying the potential subsequent characters is displayed (327). The second set of keys (205) are grouped together (323) such that their relative screen locations with respect to each other are different to that of corresponding keys in the first set of keys (204).

Abstract: Test modules, systems, and methods employing capacitors for the testing of the solder joint connections between a printed circuit board (PCB) and a socket of a device are presented in embodiments of the current invention. A test module having capacitors in parallel, and in particular embedded capacitors, can be used to test tied traces and their solder joint connections by measuring the total capacitance of the capacitors. Embodiments of the current invention present no-power tests that can be used with a variety of testing platforms and test fixtures, such as in-circuit testing (ICT) and manufacturing defect analysis (MDA.) Additionally, the test module can be used with a variety of sockets, such as a ball grid array, a pinned grid array, and a land grid array.

Abstract: Test modules, systems, and methods employing capacitors for the testing of the solder joint connections between a printed circuit board (PCB) and a socket of a device are presented in embodiments of the current invention. A test module having capacitors in parallel, and in particular embedded capacitors, can be used to test tied traces and their solder joint connections by measuring the total capacitance of the capacitors. Embodiments of the current invention present no-power tests that can be used with a variety of testing platforms and test fixtures, such as in-circuit testing (ICT) and manufacturing defect analysis (MDA.) Additionally, the test module can be used with a variety of sockets, such as a ball grid array, a pinned grid array, and a land grid array.