Patents by Inventor Syam Kumar Lalitha Gopalakrishnan Nair

Syam Kumar Lalitha Gopalakrishnan Nair has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Tile-cell interpolation
    Patent number: 10579775
    Abstract: Various implementations described herein are directed to a method that identifies a memory instance with multiple tile-cells. The memory instance has memory instance leakage data, and each tile-cell of the multiple tile-cells has tile-cell leakage data. The method subdivides the multiple tile-cells into multiple categories based on a relationship between the memory instance leakage data and the tile-cell leakage data. The method obtains measured leakage data for each tile-cell of the multiple tile-cells by simulating the memory instance based on the memory instance leakage data and the tile-cell leakage data for each category of the multiple categories. The method determines a combined leakage of the memory instance by combining the measured leakage data for each tile-cell of the multiple tile-cells.
    Type: Grant
    Filed: July 11, 2018
    Date of Patent: March 3, 2020
    Assignee: Arm Limited
    Inventors: Vincent Philippe Schuppe, Syam Kumar Lalitha Gopalakrishnan Nair, Hongwei Zhu, Neeraj Dogra, Mouli Rajaram Chollangi, Arjun R. Prasad
  • TILE-CELL INTERPOLATION
    Publication number: 20200019669
    Abstract: Various implementations described herein are directed to a method that identifies a memory instance with multiple tile-cells. The memory instance has memory instance leakage data, and each tile-cell of the multiple tile-cells has tile-cell leakage data. The method subdivides the multiple tile-cells into multiple categories based on a relationship between the memory instance leakage data and the tile-cell leakage data. The method obtains measured leakage data for each tile-cell of the multiple tile-cells by simulating the memory instance based on the memory instance leakage data and the tile-cell leakage data for each category of the multiple categories. The method determines a combined leakage of the memory instance by combining the measured leakage data for each tile-cell of the multiple tile-cells.
    Type: Application
    Filed: July 11, 2018
    Publication date: January 16, 2020
    Inventors: Vincent Philippe Schuppe, Syam Kumar Lalitha Gopalakrishnan Nair, Hongwei Zhu, Neeraj Dogra, Mouli Rajaram Chollangi, Arjun R. Prasad