Abstract: A system includes an antenna configured to emit electromagnetic waves. The system includes a radome having an interior surface facing the antenna. The interior surface at least partially includes a wave-shaped structure configured to reduce reflections of the electromagnetic waves off the interior surface and to increase transmission of the electromagnetic waves through the radome.

Abstract: This document describes techniques and systems for a vertical microstrip-to-waveguide transition. A radar system may include a monolithic microwave integrated circuit (MIMIC) to generate electromagnetic signals and a printed circuit board (PCB) that includes a first surface, a microstrip, and a grounding pattern. The microstrip can be located on the first surface and operatively connect to the MIMIC. The grounding pattern is located on the first surface and made of conductive material. The radar system also includes a transition channel positioned over the grounding pattern, which includes a vertical taper between a bottom surface and a top surface. The transition channel defines a dielectric-filled portion formed by the grounding pattern and its interior surface. The described vertical transition can reduce manufacturing costs and support a wide bandwidth by tolerating an air gap at the transition-to-waveguide interface.

Abstract: This document describes techniques, apparatuses, and systems for a waveguide with slot antennas and reflectors. An apparatus may include a waveguide channel that includes a hollow channel containing a dielectric and an array of slot antennas through a surface that is operably connected with the dielectric. The apparatus also includes reflectors positioned adjacent to and offset from each longitudinal side of the waveguide channel. The reflectors and the waveguide channel are positioned to generate a particular radiation pattern for an antenna element electrically coupled to the dielectric. In this way, the described waveguide with slot antennas and reflectors can adjust the positioning of the reflectors to provide a radiation pattern with a wide or asymmetric beamwidth.

Abstract: A test fixture for PCB components is described herein. The test fixture comprises a shim with an aperture configured to direct RF energy from a component of a PCB, via an end of the PCB, and to a top clamp of the test fixture. The end of the PCB may correspond to a cut line of a destructive test. The test fixture also comprises the top clamp with a test port and a taper configured to direct the RF energy from the aperture to the test port. The test fixture also comprises a bottom clamp attached to the top clamp to retain the PCB between the top and bottom clamps for testing. The test fixture allows for quick mounting of the PCB and testing of the component without modifying a design of the PCB or requiring specific drilling of the PCB.

Abstract: A test fixture for PCB components is described herein. The test fixture comprises a shim with an aperture configured to direct RF energy from a component of a PCB, via an end of the PCB, and to a top clamp of the test fixture. The end of the PCB may correspond to a cut line of a destructive test. The test fixture also comprises the top clamp with a test port and a taper configured to direct the RF energy from the aperture to the test port. The test fixture also comprises a bottom clamp attached to the top clamp to retain the PCB between the top and bottom clamps for testing. The test fixture allows for quick mounting of the PCB and testing of the component without modifying a design of the PCB or requiring specific drilling of the PCB.

Abstract: A test fixture for PCB components is described herein. The test fixture comprises a shim with an aperture configured to direct RF energy from a component of a PCB, via an end of the PCB, and to a top clamp of the test fixture. The end of the PCB may correspond to a cut line of a destructive test. The test fixture also comprises the top clamp with a test port and a taper configured to direct the RF energy from the aperture to the test port. The test fixture also comprises a bottom clamp attached to the top clamp to retain the PCB between the top and bottom clamps for testing. The test fixture allows for quick mounting of the PCB and testing of the component without modifying a design of the PCB or requiring specific drilling of the PCB.

Abstract: This document describes facia, including parts of vehicles, for supporting an ultra-wide radar field-of-view, for example, in automotive contexts. The facia is configured as a radome for supporting an ultra-wide field-of-view with an antenna despite the facia obstructing a field of view. The facia has one exterior surface or interior surface this is a mostly smooth or has a pattern of hemispherical indentations or domes that are configured to reduce reflections off that surface and increase light transmission through the facia. The other of the exterior or interior surface, has a pattern of hemispherical indentations or domes that are configured to reduce reflections off that surface and further increase light transmission through the facia.

Abstract: Example systems and methods for antenna pattern characterization are described herein. The systems and methods are based on compressive sensing. An example method can include arranging a test antenna and a probe antenna in a spaced apart relationship; arranging a spatial light modulator within in a near field region of the test antenna; and projecting, using a light source, a plurality of light patterns onto the spatial light modulator. The method can also include transmitting, using the test antenna, a respective beam while each of the light patterns is projected onto the spatial light modulator; and receiving, using the probe antenna, a respective signal corresponding to each of the respective beams transmitted by the test antenna. The method can further include reconstructing the test antenna's near field using the respective signals received by the probe antenna. The test antenna's near field can be reconstructed using a compressive sensing algorithm.

Abstract: Example systems and methods for antenna pattern characterization are described herein. The systems and methods are based on compressive sensing. An example method can include arranging a test antenna and a probe antenna in a spaced apart relationship; arranging a spatial light modulator within in a near field region of the test antenna; and projecting, using a light source, a plurality of light patterns onto the spatial light modulator. The method can also include transmitting, using the test antenna, a respective beam while each of the light patterns is projected onto the spatial light modulator; and receiving, using the probe antenna, a respective signal corresponding to each of the respective beams transmitted by the test antenna. The method can further include reconstructing the test antenna's near field using the respective signals received by the probe antenna. The test antenna's near field can be reconstructed using a compressive sensing algorithm.