Patents by Inventor Syed-Asif Syed-Amanulla

Syed-Asif Syed-Amanulla has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)
    Publication number: 20250147066
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Application
    Filed: January 8, 2025
    Publication date: May 8, 2025
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
    Patent number: 12241911
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Grant
    Filed: February 2, 2024
    Date of Patent: March 4, 2025
    Assignee: BRUKER NANO, INC.
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)
    Publication number: 20240175895
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Application
    Filed: February 2, 2024
    Publication date: May 30, 2024
    Applicant: BRUKER NANO, INC.
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
    Patent number: 11940461
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Grant
    Filed: April 11, 2023
    Date of Patent: March 26, 2024
    Assignee: BRUKER NANO, INC.
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
    Publication number: 20230243867
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Application
    Filed: April 11, 2023
    Publication date: August 3, 2023
    Applicant: BRUKER NANO, INC.
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
    Patent number: 11635449
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Grant
    Filed: April 18, 2022
    Date of Patent: April 25, 2023
    Assignee: BRUKER NANO, INC.
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
    Publication number: 20220252638
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Application
    Filed: April 18, 2022
    Publication date: August 11, 2022
    Applicant: BRUKER NANO, INC.
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
    Patent number: 11307220
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Grant
    Filed: April 19, 2021
    Date of Patent: April 19, 2022
    Assignee: BRUKER NANO
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
    Publication number: 20210239732
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Application
    Filed: April 19, 2021
    Publication date: August 5, 2021
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)
    Patent number: 11029330
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Grant
    Filed: August 2, 2019
    Date of Patent: June 8, 2021
    Assignee: BRUKER NANO, INC.
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla
  • Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
    Publication number: 20200041541
    Abstract: An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
    Type: Application
    Filed: August 2, 2019
    Publication date: February 6, 2020
    Inventors: Sergey Osechinskiy, Anthonius Ruiter, Bede Pittenger, Syed-Asif Syed-Amanulla