Patents by Inventor Syed Jaffar Shah

Syed Jaffar Shah has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10841019
    Abstract: Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a cross-correlation measurement, and the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.
    Type: Grant
    Filed: September 12, 2019
    Date of Patent: November 17, 2020
    Assignee: NATIONAL INSTRUMENTS CORPORATION
    Inventors: Syed Jaffar Shah, Edward B. Loewenstein
  • Patent number: 10243678
    Abstract: Dynamic characterization of complex high-order nonlinearity in transmitter (TX) and receiver (RX) signal chains of transceiver systems can be efficiently and accurately performed. A loopback connection may be used to facilitate self-characterization. Appropriate RX and TX configuration settings may be developed to facilitate de-coupling of individual RX and TX nonlinearities from measured cascade nonlinearity. The system's high-order response to a two-tone signal generation may be measured, and complex mathematical analysis may be performed to identify and isolate passband nonlinear components to extract a high-order memory-less model for the system. The extracted system model may be used in the corrective and non-iterative pre-distortion of generated signals and in the post-distortion of received signals to improve linearity performance of the transceiver.
    Type: Grant
    Filed: July 11, 2014
    Date of Patent: March 26, 2019
    Assignee: National Instruments Corporation
    Inventors: Mohamad A. Zeidan, Christopher J. Behnke, Syed Jaffar Shah
  • Publication number: 20150118971
    Abstract: Dynamic characterization of complex high-order nonlinearity in transmitter (TX) and receiver (RX) signal chains of transceiver systems can be efficiently and accurately performed. A loopback connection may be used to facilitate self-characterization. Appropriate RX and TX configuration settings may be developed to facilitate de-coupling of individual RX and TX nonlinearities from measured cascade nonlinearity. The system's high-order response to a two-tone signal generation may be measured, and complex mathematical analysis may be performed to identify and isolate passband nonlinear components to extract a high-order memory-less model for the system. The extracted system model may be used in the corrective and non-iterative pre-distortion of generated signals and in the post-distortion of received signals to improve linearity performance of the transceiver.
    Type: Application
    Filed: July 11, 2014
    Publication date: April 30, 2015
    Inventors: Mohamad A. Zeidan, Christopher J. Behnke, Syed Jaffar Shah