Patents by Inventor Sylvain Rivet

Sylvain Rivet has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Device for polarimetrically characterising the anisotropy of a medium, and corresponding imaging system
    Patent number: 12270753
    Abstract: A device is provided for polarimetrically characterising anisotropy of a medium. The device includes a light source, spectral polarisation coding and decoding elements, and a light detector. The coding element includes a spectral modulator composed of at least one chromatic phase delay plate shaped as a function of a saturation threshold of the light detector.
    Type: Grant
    Filed: July 16, 2021
    Date of Patent: April 8, 2025
    Assignee: UNIVERSITE DE BRETAGNE OCCIDENTALE
    Inventors: Yann Le Grand, Sylvain Rivet, Matthieu Dubreuil, Xavier Theillier
  • Device for polarimetrically characterising the anisotropy of a medium, and corresponding imaging system
    Publication number: 20230273116
    Abstract: A device is provided for polarimetrically characterising anisotropy of a medium. The device includes a light source, spectral polarisation coding and decoding elements, and a light detector. The coding element includes a spectral modulator composed of at least one chromatic phase delay plate shaped as a function of a saturation threshold of the light detector.
    Type: Application
    Filed: July 16, 2021
    Publication date: August 31, 2023
    Inventors: Yann Le Grand, Sylvain Rivet, Matthieu Dubreuil, Xavier Theillier
  • Apparatus and method for processing the signal in master slave interferometry and apparatus and method for master slave optical coherence tomography with any number of sampled depths
    Patent number: 10760893
    Abstract: The present invention related to an apparatus and method for master slave interferometry, referred to as Complex Master Slave (CMS). The method and apparatus can be used to provide complex-valued measurements of a signal reflected from an axial position inside an object or of signals reflected from points at several axial positions inside an object.
    Type: Grant
    Filed: October 26, 2016
    Date of Patent: September 1, 2020
    Assignee: UNIVERSITY OF KENT
    Inventors: Adrian Podoleanu, Sylvain Rivet, Adrian Bradu, Michael Maria