Patents by Inventor Sylvain Simon Coulombe

Sylvain Simon Coulombe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20040185740
    Abstract: A method of making an electron emissive material using combinatorial chemistry techniques is provided. The method includes providing a plurality of pixels of the electron emissive material, each pixel having at least one different characteristic from any other one of the plurality of pixels, and measuring at least one property of each pixel. The measurement may include a measurement of the electron emissive material work function using a Kelvin probe or other work function measurement systems.
    Type: Application
    Filed: January 27, 2004
    Publication date: September 23, 2004
    Inventors: Sung Su Han, Sylvain Simon Coulombe
  • Patent number: 6749776
    Abstract: A method of making an electron emissive material using combinatorial chemistry techniques is provided. The method includes providing a plurality of pixels of the electron emissive material, each pixel having at least one different characteristic from any other one of the plurality of pixels, and measuring at least one property of each pixel. The measurement may include a measurement of the electron emissive material work function using a Kelvin probe or other work function measurement systems.
    Type: Grant
    Filed: December 4, 2000
    Date of Patent: June 15, 2004
    Assignee: General Electric Company
    Inventors: Sung Su Han, Sylvain Simon Coulombe
  • Publication number: 20020067120
    Abstract: A method of making an electron emissive material using combinatorial chemistry techniques is provided. The method includes providing a plurality of pixels of the electron emissive material, each pixel having at least one different characteristic from any other one of the plurality of pixels, and measuring at least one property of each pixel. The measurement may include a measurement of the electron emissive material work function using a Kelvin probe or other work function measurement systems.
    Type: Application
    Filed: December 4, 2000
    Publication date: June 6, 2002
    Applicant: General Electric Company
    Inventors: Sung Su Han, Sylvain Simon Coulombe