Patents by Inventor Syoji Matsuda

Syoji Matsuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11945414
    Abstract: A vehicle windshield wiper blade comprising: a blade support portion; and a lip portion, wherein the lip portion has a tapered portion having a cross section that is taken along a direction perpendicular to the longitudinal direction of the wiper blade and that has a width that gradually decreases from a side closer to the blade support portion towards a direction farthest away from the blade support portion, the lip portion has a tip surface and first and second tapered surfaces constituting the tapered portion, and, in a specific observation region of the first and second tapered surfaces, the average value of the elastic modulus measured at a 0.1 ?m pitch is 15-470 MPa and the coefficient of variation of the elastic modulus is at most 17.6%.
    Type: Grant
    Filed: January 24, 2023
    Date of Patent: April 2, 2024
    Assignee: Canon Kabushiki Kaisha
    Inventors: Takehiko Aoyama, Masanori Yokoyama, Syoji Inoue, Arihiro Yamamoto, Hidekazu Matsuda, Shota Segawa
  • Patent number: 6548139
    Abstract: In a glass substrate for use in a magnetic recording medium, a surface roughness of at least a principal surface of the glass substrate is measured by the use of the interatomic force microscope (AFM), Ra falls within the range between 0.2 and 2.5 nm, Rmax falls within the range between 3 and 25 nm, and Rmax/Ra falls within the range between 3 and 35.
    Type: Grant
    Filed: February 14, 2002
    Date of Patent: April 15, 2003
    Assignee: Hoya Corporation
    Inventors: Hiroyuki Sakai, Katsutoshi Ono, Syoji Matsuda
  • Publication number: 20020142191
    Abstract: In a glass substrate for use in a magnetic recording medium, a surface roughness of at least a principal surface of the glass substrate is measured by the use of the interatomic force microscope (AFM), Ra falls within the range between 0.2 and 2.5 nm, Rmax falls within the range between 3 and 25 nm, and Rmax/Ra falls within the range between 3 and 35.
    Type: Application
    Filed: February 14, 2002
    Publication date: October 3, 2002
    Applicant: HOYA CORPORATION
    Inventors: Hiroyuki Sakai, Katsutoshi Ono, Syoji Matsuda
  • Patent number: 6383404
    Abstract: In a glass substrate for use in a magnetic recording medium, a surface roughness of at least a principal surface of the glass substrate is measured by the use of the interatomic force microscope (AFM), Ra falls within the range between 0.2 and 2.5 nm, Rmax falls within the range between 3 and 25 nm, and Rmax/Ra falls within the range between 3 and 35.
    Type: Grant
    Filed: August 19, 1999
    Date of Patent: May 7, 2002
    Assignee: Hoya Corporation
    Inventors: Hiroyuki Sakai, Katsutoshi Ono, Syoji Matsuda