Patents by Inventor Syu JIMBO

Syu JIMBO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8699035
    Abstract: An inspection apparatus and an inspection method is provided having a wafer chuck stage equipped with one or more wafer chucks; a position measurement unit for measuring the positions of the light emitting devices on each of the expanded wafers loaded respectively on the wafer chucks; a photodetector and at least one probe provided corresponding to each of the expanded wafers; and a control unit provided with means for moving the wafer chuck stage in the X axis and/or Y-axis directions such that the light emitting devices on each of the expanded wafers are sequentially brought under the corresponding probes, means for moving each of the probes to a place corresponding to the electrodes in the light emitting devices, and means for bringing the probes into contact with the corresponding electrodes.
    Type: Grant
    Filed: August 27, 2012
    Date of Patent: April 15, 2014
    Assignee: Kabushiki Kaisha Nihon Micronics
    Inventors: Syu Jimbo, Norie Yamaguchi, Keita Koyahara
  • Publication number: 20130050691
    Abstract: An inspection apparatus and an inspection method is provided having a wafer chuck stage equipped with one or more wafer chucks; a position measurement unit for measuring the positions of the light emitting devices on each of the expanded wafers loaded respectively on the wafer chucks; a photodetector and at least one probe provided corresponding to each of the expanded wafers; and a control unit provided with means for moving the wafer chuck stage in the X axis and/or Y-axis directions such that the light emitting devices on each of the expanded wafers are sequentially brought under the corresponding probes, means for moving each of the probes to a place corresponding to the electrodes in the light emitting devices, and means for bringing the probes into contact with the corresponding electrodes.
    Type: Application
    Filed: August 27, 2012
    Publication date: February 28, 2013
    Applicant: KABUSHIKI KAISHANIHON MICRONICS
    Inventors: Syu JIMBO, Norie YAMAGUCHI, Keita KOYAHARA