Patents by Inventor Syuichirou Takahasi

Syuichirou Takahasi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test board for testing a semiconductor device, method of testing the semiconductor device, contact device, test method using the contact device, and test jig for testing the semiconductor device
    Patent number: 5831441
    Abstract: A test board used for testing a semiconductor device provided with projection electrodes includes a main board and testing electrodes. The testing electrodes are provided on the main board, each projecting upwardly from the main board. When the semiconductor device is tested, the testing electrodes are electrically connected to the projection electrodes by insertion of the testing electrodes into the projection electrodes. The semiconductor device is mounted on the main board to test the semiconductor device through the testing electrodes.
    Type: Grant
    Filed: March 8, 1996
    Date of Patent: November 3, 1998
    Assignee: Fujitsu Limited
    Inventors: Toshiyuki Motooka, Syuichirou Takahasi, Tatsuharu Matsuda, Kunio Kodama, Joji Fujimori, Shigeki Harada, Masataka Mizukoshi, Masashi Takenaka, Tatsuro Yamashita