Patents by Inventor Syuji Ishikawa

Syuji Ishikawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Inspection system for device to be tested, and method for operating inspection system for device to be tested
    Patent number: 10161990
    Abstract: In an inspection system for a device to be tested, a stage, on which a device to be tested and a diode are loaded, is moved to a static characteristic test station and a dynamic characteristic test station. A method for operating an inspection system for a device to be tested includes a process of carrying in and loading the stage, on which the device to be tested and the diode are loaded, a process of carrying in and fixing the device to be tested to a test station, a process of bringing a probe into contact with the diode, a process of switching a position of the diode, a process of performing a measurement with respect to the device to be tested, a process of carrying out the device to be tested from the stage, and a process of classifying the device to be tested.
    Type: Grant
    Filed: February 5, 2015
    Date of Patent: December 25, 2018
    Assignee: SINTOKOGIO, LTD.
    Inventors: Nobuyuki Takita, Takayuki Hamada, Yoichi Sakamoto, Syuji Ishikawa
  • INSPECTION SYSTEM FOR DEVICE TO BE TESTED, AND METHOD FOR OPERATING INSPECTION SYSTEM FOR DEVICE TO BE TESTED
    Publication number: 20170023636
    Abstract: In an inspection system for a device to be tested, a stage, on which a device to be tested and a diode are loaded, is moved to a static characteristic test station and a dynamic characteristic test station. A method for operating an inspection system for a device to be tested includes a process of carrying in and loading the stage, on which the device to be tested and the diode are loaded, a process of carrying in and fixing the device to be tested to a test station, a process of bringing a probe into contact with the diode, a process of switching a position of the diode, a process of performing a measurement with respect to the device to be tested, a process of carrying out the device to be tested from the stage, and a process of classifying the device to be tested.
    Type: Application
    Filed: February 5, 2015
    Publication date: January 26, 2017
    Inventors: Nobuyuki TAKITA, Takayuki HAMADA, Yoichi SAKAMOTO, Syuji ISHIKAWA
  • FRP molded article and method of producing the same
    Patent number: 6749934
    Abstract: An FRP molded article molded by hot runner injection molding with a mixture of thermoplastic resin and reinforcing fibers of 0.1-7 mm in average length dispersed in the thermoplastic resin; and a hot runner injection molding method therefore. The molded article is preferable for use as a housing for electronic terminal equipment, cellular phones, etc.
    Type: Grant
    Filed: August 20, 2002
    Date of Patent: June 15, 2004
    Assignee: Toray Industries, Inc.
    Inventors: Kazuki Nagayama, Hideki Nudeshima, Syuji Ishikawa, Hideaki Tanisugi
  • Frp molded article and method of producing the same
    Publication number: 20030026984
    Abstract: An FRP molded article molded by hot runner injection molding with a mixture of thermoplastic resin and reinforcing fibers of 0.1-7 mm in average length dispersed in the thermoplastic resin; and a hot runner injection molding method therefore. The molded article is preferable for use as a housing for electronic terminal equipment, cellular phones, etc.
    Type: Application
    Filed: August 20, 2002
    Publication date: February 6, 2003
    Inventors: Kazuki Nagayama, Hideki Nudeshima, Syuji Ishikawa, Hideaki Tanisugi