Patents by Inventor Syun'itirou Wakamiya

Syun'itirou Wakamiya has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5500767
    Abstract: An objective lens is corrected for spherical aberration at both an operating wavelength and a measurement wavelength, such that the amount of spherical aberration to develop at the operating wavelength is substantially equal to the amount of spherical aberration to develop at a measuring wavelength. The method of lens performance measurement then uses a light source emitting at a wavelength different from the operating wavelength.
    Type: Grant
    Filed: July 11, 1994
    Date of Patent: March 19, 1996
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Koichi Maruyama, Syun'itirou Wakamiya, Makoto Iwaki, Masahiro Oono
  • Patent number: 5335059
    Abstract: A method and apparatus for lens measurement that provide for a small error of measurement where a light source used for measurement emits a beam of light at a wavelength different from an operating wavelength of a lens to be measured. The spherical aberration of the lens being measured, which occurs at the nonoperating wavelength, is identified and measured. An auxiliary lens is then placed in the path of the light source emitting the beam of light with the nonoperating wavelength to suppress the spherical aberration. This method allows for performance measurements of the lens to be obtained at the nonoperating wavelength without the adverse effects of the spherical aberration which occurred at the nonoperating wavelength.
    Type: Grant
    Filed: May 5, 1992
    Date of Patent: August 2, 1994
    Assignee: Asahi Kogaku Kogyo Kabushiki Kaisha
    Inventors: Koichi Maruyuma, Syun'itirou Wakamiya, Makoto Iwaki