Patents by Inventor Sze Meng Tan

Sze Meng Tan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9267880
    Abstract: For cavity enhanced optical spectroscopy, the cavity modes are used as a frequency reference. Data analysis methods are employed that assume the data points are at equally spaced frequencies. Parameters of interest such as line width, integrated absorption etc. can be determined from such data without knowledge of the frequencies of any of the data points. Methods for determining the FSR index of each ring-down event are also provided.
    Type: Grant
    Filed: February 27, 2015
    Date of Patent: February 23, 2016
    Assignee: Picarro, Inc.
    Inventors: Sze Meng Tan, John A. Hoffnagle, Chris W. Rella
  • Publication number: 20160011069
    Abstract: This work provides event selection in the context of gas leak pinpointing using mobile gas concentration and atmospheric measurements. The main idea of the present approach is to use a moving minimum to estimate background gas concentration, as opposed to the conventional use of a moving average for this background estimation.
    Type: Application
    Filed: July 8, 2014
    Publication date: January 14, 2016
    Inventors: David Steele, Eric R. Crosson, Sze Meng Tan
  • Patent number: 9116042
    Abstract: In cavity ring-down spectroscopy (CRDS), scattering into the backward mode of a traveling wave ring-down cavity can degrade conventional CRDS performance. We have found that this performance degradation can be alleviated by measuring the backward mode signal emitted from the ring-down cavity, and using this signal to improve the processing for extracting ring-down times from the measured data. For example, fitting an exponential to the sum of the intensities of the forward and backward signals often provides substantially better results for the ring-down time than fitting an exponential to the forward signal alone. Other possibilities include extracting cavity eigenmode signals from the forward and backward signals and performing separate exponential fits to the eigenmode signals. An optical circulator can be used to facilitate measurement of the backward mode signal.
    Type: Grant
    Filed: August 30, 2013
    Date of Patent: August 25, 2015
    Assignee: Picarro, Inc.
    Inventors: Yonggang He, Sze Meng Tan, Alejandro Dario Farinas
  • Patent number: 8982352
    Abstract: For cavity enhanced optical spectroscopy, the cavity modes are used as a frequency reference. Data analysis methods are employed that assume the data points are at equally spaced frequencies. Parameters of interest such as line width, integrated absorption etc. can be determined from such data without knowledge of the frequencies of any of the data points.
    Type: Grant
    Filed: September 26, 2013
    Date of Patent: March 17, 2015
    Assignee: Picarro, Inc.
    Inventors: John A. Hoffnagle, Sze Meng Tan, Chris W. Rella
  • Publication number: 20150007638
    Abstract: Improved gas leak detection from moving platforms is provided. Automatic horizontal spatial scale analysis can be performed in order to distinguish a leak from background levels of the measured gas. Source identification can be provided by using isotopic ratios and/or chemical tracers to distinguish gas leaks from other sources of the measured gas. Multi-point measurements combined with spatial analysis of the multi-point measurement results can provide leak source distance estimates. Qualitative source identification is provided. These methods can be practiced individually or in any combination.
    Type: Application
    Filed: September 23, 2014
    Publication date: January 8, 2015
    Inventors: Chris W. Rella, Eric R. Crosson, Michael R. Woelk, Sze Meng Tan, Yonggang He, David Steele
  • Patent number: 8537362
    Abstract: In cavity ring-down spectroscopy (CRDS), scattering into the backward mode of a traveling wave ring-down cavity can degrade conventional CRDS performance. We have found that this performance degradation can be alleviated by measuring the backward mode signal emitted from the ring-down cavity, and using this signal to improve the processing for extracting ring-down times from the measured data. For example, fitting an exponential to the sum of the intensities of the forward and backward signals often provides substantially better results for the ring-down time than fitting an exponential to the forward signal alone. Other possibilities include extracting cavity eigenmode signals from the forward and backward signals and performing separate exponential fits to the eigenmode signals.
    Type: Grant
    Filed: March 18, 2011
    Date of Patent: September 17, 2013
    Assignee: Picarro, Inc.
    Inventors: Yonggang He, Sze Meng Tan, Bruce A. Richman
  • Publication number: 20120242997
    Abstract: In cavity ring-down spectroscopy (CRDS), scattering into the backward mode of a traveling wave ring-down cavity can degrade conventional CRDS performance. We have found that this performance degradation can be alleviated by measuring the backward mode signal emitted from the ring-down cavity, and using this signal to improve the processing for extracting ring-down times from the measured data. For example, fitting an exponential to the sum of the intensities of the forward and backward signals often provides substantially better results for the ring-down time than fitting an exponential to the forward signal alone. Other possibilities include extracting cavity eigenmode signals from the forward and backward signals and performing separate exponential fits to the eigenmode signals.
    Type: Application
    Filed: March 18, 2011
    Publication date: September 27, 2012
    Inventors: Yonggang He, Sze Meng Tan, Bruce A. Richman
  • Patent number: 7813886
    Abstract: Improved calibration of a dual-etalon frequency monitor having x-y outputs is provided. An ellipse is fit to the (x,y) points from a set of calibration data. For each (x,y) point, an angle ? is determined. A linear fit of frequency to ? is provided. Differences between this linear fit and the determined values of ? are accounted for by including a spline fit to this difference in the calibration.
    Type: Grant
    Filed: December 4, 2007
    Date of Patent: October 12, 2010
    Assignee: Picarro, Inc.
    Inventor: Sze Meng Tan
  • Patent number: 7420686
    Abstract: In a dual etalon wavelength monitor, improved performance is obtained by identifying first and second dead zones where the first and second etalon signals respectively have significantly reduced sensitivity. When a measurement is in the first dead zone, only the second etalon signal is employed to determine wavelength. When a measurement is in the second dead zone, only the first etalon signal is employed to determine wavelength. When a measurement is in neither zone, both first and second etalon signals are employed to determine the wavelength.
    Type: Grant
    Filed: January 8, 2007
    Date of Patent: September 2, 2008
    Assignee: Picarro, Inc.
    Inventor: Sze Meng Tan
  • Publication number: 20080137089
    Abstract: Improved calibration of a dual-etalon frequency monitor having x-y outputs is provided. An ellipse is fit to the (x,y) points from a set of calibration data. For each (x,y) point, an angle ? is determined. A linear fit of frequency to ? is provided. Differences between this linear fit and the determined values of ? are accounted for by including a spline fit to this difference in the calibration.
    Type: Application
    Filed: December 4, 2007
    Publication date: June 12, 2008
    Inventor: Sze Meng Tan
  • Publication number: 20070195328
    Abstract: In a dual etalon wavelength monitor, improved performance is obtained by identifying first and second dead zones where the first and second etalon signals respectively have significantly reduced sensitivity. When a measurement is in the first dead zone, only the second etalon signal is employed to determine wavelength. When a measurement is in the second dead zone, only the first etalon signal is employed to determine wavelength. When a measurement is in neither zone, both first and second etalon signals are employed to determine the wavelength.
    Type: Application
    Filed: January 8, 2007
    Publication date: August 23, 2007
    Inventor: Sze Meng Tan