Patents by Inventor SZU-JU HUANG

SZU-JU HUANG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240071849
    Abstract: A semiconductor package including one or more dam structures and the method of forming are provided. A semiconductor package may include an interposer, a semiconductor die bonded to a first side of the interposer, an encapsulant on the first side of the interposer encircling the semiconductor die, a substrate bonded to the a second side of the interposer, an underfill between the interposer and the substrate, and one or more of dam structures on the substrate. The one or more dam structures may be disposed adjacent respective corners of the interposer and may be in direct contact with the underfill. The coefficient of thermal expansion of the one or more of dam structures may be smaller than the coefficient of thermal expansion of the underfill.
    Type: Application
    Filed: August 26, 2022
    Publication date: February 29, 2024
    Inventors: Jian-You Chen, Kuan-Yu Huang, Li-Chung Kuo, Chen-Hsuan Tsai, Kung-Chen Yeh, Hsien-Ju Tsou, Ying-Ching Shih, Szu-Wei Lu
  • Publication number: 20230385521
    Abstract: Systems and methods are provided for predicting systematic design rule check (DRC) violations in a placement layout before routing is performed on the placement layout. A systematic DRC violation prediction system includes DRC violation prediction circuitry. The DRC violation prediction circuitry receives placement data associated with a placement layout. The DRC violation prediction circuitry inspects the placement data associated with the placement layout, and the placement data may include data associated with a plurality of regions of the placement layout, which may be inspected on a region-by-region basis. The DRC violation prediction circuitry predicts whether one or more systematic DRC violations would be present in the placement layout due to a subsequent routing of the placement layout.
    Type: Application
    Filed: August 10, 2023
    Publication date: November 30, 2023
    Inventors: Yi-Lin CHUANG, Shih-Yao LIN, Szu-ju HUANG, Yin-An CHEN, Shih Feng HONG
  • Publication number: 20230385520
    Abstract: Systems and methods are provided for predicting systematic design rule check (DRC) violations in a placement layout before routing is performed on the placement layout. A systematic DRC violation prediction system includes DRC violation prediction circuitry. The DRC violation prediction circuitry receives placement data associated with a placement layout. The DRC violation prediction circuitry inspects the placement data associated with the placement layout, and the placement data may include data associated with a plurality of regions of the placement layout, which may be inspected on a region-by-region basis. The DRC violation prediction circuitry predicts whether one or more systematic DRC violations would be present in the placement layout due to a subsequent routing of the placement layout.
    Type: Application
    Filed: August 9, 2023
    Publication date: November 30, 2023
    Inventors: Yi-Lin CHUANG, Shih-Yao LIN, Szu-ju HUANG, Yin-An CHEN, Shih Feng HONG
  • Patent number: 11816417
    Abstract: Systems and methods are provided for predicting systematic design rule check (DRC) violations in a placement layout before routing is performed on the placement layout. A systematic DRC violation prediction system includes DRC violation prediction circuitry. The DRC violation prediction circuitry receives placement data associated with a placement layout. The DRC violation prediction circuitry inspects the placement data associated with the placement layout, and the placement data may include data associated with a plurality of regions of the placement layout, which may be inspected on a region-by-region basis. The DRC violation prediction circuitry predicts whether one or more systematic DRC violations would be present in the placement layout due to a subsequent routing of the placement layout.
    Type: Grant
    Filed: February 22, 2021
    Date of Patent: November 14, 2023
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-ju Huang, Yin-An Chen, Amos Hong
  • Publication number: 20230214575
    Abstract: Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.
    Type: Application
    Filed: March 13, 2023
    Publication date: July 6, 2023
    Inventors: Yi-Lin Chuang, Szu-ju Huang, Shih-Yao Lin, Shih Feng Hong, Yin-An Chen
  • Patent number: 11604917
    Abstract: Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.
    Type: Grant
    Filed: August 9, 2021
    Date of Patent: March 14, 2023
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-Ju Huang, Yin-An Chen, Amos Hong
  • Patent number: 11263375
    Abstract: A method, for determining constraints related to a target circuit, includes following operations. First circuit speed results of the target circuit under different candidate constraint configurations are accumulated. Breakthrough probability distributions relative to each of the candidate constraint configurations are determined according to the first circuit speed results. First selected constraint configurations are determined from the candidate constraint configurations by sampling the breakthrough probability distributions. A first budget distribution is determined among the first selected constraint configurations. In response to that the first budget distribution is converged, the first selected constraint configurations in the first budget distribution is utilized for implementing the target circuit and generating an updated circuit speed result of the target circuit.
    Type: Grant
    Filed: June 30, 2020
    Date of Patent: March 1, 2022
    Assignees: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD., TSMC NANJING COMPANY LIMITED
    Inventors: Yi-Lin Chuang, Shi-Wen Tan, Szu-Ju Huang, Shih-Feng Hong
  • Publication number: 20210365620
    Abstract: A method, for determining constraints related to a target circuit, includes following operations. First circuit speed results of the target circuit under different candidate constraint configurations are accumulated. Breakthrough probability distributions relative to each of the candidate constraint configurations are determined according to the first circuit speed results. First selected constraint configurations are determined from the candidate constraint configurations by sampling the breakthrough probability distributions. A first budget distribution is determined among the first selected constraint configurations. In response to that the first budget distribution is converged, the first selected constraint configurations in the first budget distribution is utilized for implementing the target circuit and generating an updated circuit speed result of the target circuit.
    Type: Application
    Filed: June 30, 2020
    Publication date: November 25, 2021
    Applicants: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD., TSMC NANJING COMPANY LIMITED
    Inventors: Yi-Lin CHUANG, Shi-Wen TAN, Szu-Ju HUANG, Shih-Feng HONG
  • Publication number: 20210365624
    Abstract: Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.
    Type: Application
    Filed: August 9, 2021
    Publication date: November 25, 2021
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-Ju Huang, Yin-An Chen, Amos Hong
  • Patent number: 11087066
    Abstract: Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.
    Type: Grant
    Filed: September 21, 2020
    Date of Patent: August 10, 2021
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-Ju Huang, Yin-An Chen, Amos Hong
  • Publication number: 20210174000
    Abstract: Systems and methods are provided for predicting systematic design rule check (DRC) violations in a placement layout before routing is performed on the placement layout. A systematic DRC violation prediction system includes DRC violation prediction circuitry. The DRC violation prediction circuitry receives placement data associated with a placement layout. The DRC violation prediction circuitry inspects the placement data associated with the placement layout, and the placement data may include data associated with a plurality of regions of the placement layout, which may be inspected on a region-by-region basis. The DRC violation prediction circuitry predicts whether one or more systematic DRC violations would be present in the placement layout due to a subsequent routing of the placement layout.
    Type: Application
    Filed: February 22, 2021
    Publication date: June 10, 2021
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-ju Huang, Yin-An Chen, Amos Hong
  • Patent number: 10943049
    Abstract: Systems and methods are provided for predicting systematic design rule check (DRC) violations in a placement layout before routing is performed on the placement layout. A systematic DRC violation prediction system includes DRC violation prediction circuitry. The DRC violation prediction circuitry receives placement data associated with a placement layout. The DRC violation prediction circuitry inspects the placement data associated with the placement layout, and the placement data may include data associated with a plurality of regions of the placement layout, which may be inspected on a region-by-region basis. The DRC violation prediction circuitry predicts whether one or more systematic DRC violations would be present in the placement layout due to a subsequent routing of the placement layout.
    Type: Grant
    Filed: May 1, 2019
    Date of Patent: March 9, 2021
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-Ju Huang, Yin-An Chen, Amos Hong
  • Publication number: 20210004519
    Abstract: Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.
    Type: Application
    Filed: September 21, 2020
    Publication date: January 7, 2021
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-Ju Huang, Yin-An Chen, Amos Hong
  • Patent number: 10810346
    Abstract: Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.
    Type: Grant
    Filed: June 3, 2019
    Date of Patent: October 20, 2020
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-Ju Huang, Yin-An Chen, Amos Hong
  • Publication number: 20200104457
    Abstract: Systems and methods are provided for predicting systematic design rule check (DRC) violations in a placement layout before routing is performed on the placement layout. A systematic DRC violation prediction system includes DRC violation prediction circuitry. The DRC violation prediction circuitry receives placement data associated with a placement layout. The DRC violation prediction circuitry inspects the placement data associated with the placement layout, and the placement data may include data associated with a plurality of regions of the placement layout, which may be inspected on a region-by-region basis. The DRC violation prediction circuitry predicts whether one or more systematic DRC violations would be present in the placement layout due to a subsequent routing of the placement layout.
    Type: Application
    Filed: May 1, 2019
    Publication date: April 2, 2020
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-Ju Huang, Yin-An Chen, Amos Hong
  • Publication number: 20200104458
    Abstract: Systems and methods are provided for predicting static voltage (SIR) drop violations in a clock-tree synthesis (CTS) layout before routing is performed on the CTS layout. A static voltage (SIR) drop violation prediction system includes SIR drop violation prediction circuitry. The SIR drop violation prediction circuitry receives CTS data associated with a CTS layout. The SIR drop violation prediction circuitry inspects the CTS layout data associated with the CTS layout, and the CTS layout data may include data associated with a plurality of regions of the CTS layout, which may be inspected on a region-by-region basis. The SIR drop violation prediction circuitry predicts whether one or more SIR drop violations would be present in the CTS layout due to a subsequent routing of the CTS layout.
    Type: Application
    Filed: June 3, 2019
    Publication date: April 2, 2020
    Inventors: Yi-Lin Chuang, Henry Lin, Szu-Ju Huang, Yin-An Chen, Amos Hong
  • Patent number: 10268795
    Abstract: A method for timing optimization is disclosed. The method includes obtaining information on detour locations of a chip by performing a routing operation, establishing, through machine learning, a model that describes a relationship between an image map and the detour locations, generating predicted detour locations based on the model and the image map, determining the probability of detouring in a region of the predicted detour locations, determining a predicted detour net for a path in a region having a high probability of detour, and determining sensitivity of the path.
    Type: Grant
    Filed: April 20, 2017
    Date of Patent: April 23, 2019
    Assignee: Taiwan Semiconductor Manufacturing Company Ltd.
    Inventors: Yi-Lin Chuang, Chih-Tien Chang, Kuan-Hua Su, Szu-Ju Huang
  • Publication number: 20180307790
    Abstract: A method for timing optimization is disclosed. The method includes obtaining information on detour locations of a chip by performing a routing operation, establishing, through machine learning, a model that describes a relationship between an image map and the detour locations, generating predicted detour locations based on the model and the image map, determining the probability of detouring in a region of the predicted detour locations, determining a predicted detour net for a path in a region having a high probability of detour, and determining sensitivity of the path.
    Type: Application
    Filed: April 20, 2017
    Publication date: October 25, 2018
    Inventors: YI-LIN CHUANG, CHIH-TIEN CHANG, KUAN-HUA SU, SZU-JU HUANG
  • Patent number: D1024051
    Type: Grant
    Filed: August 10, 2021
    Date of Patent: April 23, 2024
    Assignee: Acer Incorporated
    Inventors: Hui-Jung Huang, Hong-Kuan Li, I-Lun Li, Ling-Mei Kuo, Kuan-Ju Chen, Fang-Ying Huang, Kai-Hung Huang, Szu-Wei Yang, Kai-Teng Cheng