Patents by Inventor Szu-Shan Lo

Szu-Shan Lo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6928038
    Abstract: A circuit in an optical read/write device for protecting synchronizing patterns is proposed. The protection circuit utilizes a clock with constant frequency as a reference clock. The circuit for protecting synchronizing patterns of this present invention includes a SYNC detector, a frame period counter, a valid-frame-period judgment unit, a frame period memory, a window generator, a real SYNC judgment unit, a SYNC lock judgment unit, and a SYNC signal generator. The circuit counts the pulse number of a reference clock with constant frequency for each frame to get a constant frame period. Then, the circuit can correctly interpolate the lost frame SYNC signal immediately by counting the reference clock, when the disk is defected.
    Type: Grant
    Filed: May 7, 2002
    Date of Patent: August 9, 2005
    Assignee: Media Tek Inc.
    Inventors: Chao-Long Tsai, Andrew Chang, Szu-Shan Lo
  • Patent number: 6829295
    Abstract: A jitter measuring method and device, which is capable of measuring jitters in serial digital signal without high-frequency reference clock. The jitter measuring device comprises a rough length measuring unit for measuring rough length for each pulse of the serial digital signal according to a reference clock, and a phase error measuring unit for measuring the phase errors between the edges of the reference clock and the serial digital signal by multi-phase clocks, which are generated by a multi-phase generator according to the reference clock. The jitter measuring device computes the precise length according to the rough length and the phase error, and measures the jitters from the precise length by filters.
    Type: Grant
    Filed: May 16, 2003
    Date of Patent: December 7, 2004
    Assignee: MediaTek Inc.
    Inventors: Ming-Yang Chao, Szu-Shan Lo
  • Publication number: 20030215037
    Abstract: A jitter measuring method and device, which is capable of measuring jitters in serial digital signal without high-frequency reference clock. The jitter measuring device comprises a rough length measuring unit for measuring rough length for each pulse of the serial digital signal according to a reference clock, and a phase error measuring unit for measuring the phase errors between the edges of the reference clock and the serial digital signal by multi-phase clocks, which are generated by a multi-phase generator according to the reference clock. The jitter measuring device computes the precise length according to the rough length and the phase error, and measures the jitters from the precise length by filters.
    Type: Application
    Filed: May 16, 2003
    Publication date: November 20, 2003
    Inventors: Ming-Yang Chao, Szu-Shan Lo
  • Publication number: 20020172111
    Abstract: A circuit in an optical read/write device for protecting synchronizing patterns is proposed. The protection circuit utilizes a clock with constant frequency as a reference clock. The circuit for protecting synchronizing patterns of this present invention includes a SYNC detector, a frame period counter, a valid-frame-period judgment unit, a frame period memory, a window generator, a real SYNC judgment unit, a SYNC lock judgment unit, and a SYNC signal generator. The circuit counts the pulse number of a reference clock with constant frequency for each frame to get a constant frame period. Then, the circuit can correctly interpolate the lost frame SYNC signal immediately by counting the reference clock, when the disk is defected.
    Type: Application
    Filed: May 7, 2002
    Publication date: November 21, 2002
    Inventors: Chao-Long Tsai, Andrew Chang, Szu-Shan Lo
  • Patent number: RE41195
    Abstract: A jitter measuring method and device, which is capable of measuring jitters in serial digital signal without high-frequency reference clock. The jitter measuring device comprises a rough length measuring unit for measuring rough length for each pulse of the serial digital signal according to a reference clock, and a phase error measuring unit for measuring the phase errors between the edges of the reference clock and the serial digital signal by multi-phase clocks, which are generated by a multi-phase generator according to the reference clock. The jitter measuring device computes the precise length according to the rough length and the phase error, and measures the jitters from the precise length by filters.
    Type: Grant
    Filed: November 15, 2006
    Date of Patent: April 6, 2010
    Assignee: Mediatek Inc.
    Inventors: Ming-Yang Chao, Szu-Shan Lo
  • Patent number: RE43761
    Abstract: A jitter measuring method and device, which is capable of measuring jitters in serial digital signal without high-frequency reference clock. The jitter measuring device comprises a rough length measuring unit for measuring rough length for each pulse of the serial digital signal according to a reference clock, and a phase error measuring unit for measuring the phase errors between the edges of the reference clock and the serial digital signal by multi-phase clocks, which are generated by a multi-phase generator according to the reference clock. The jitter measuring device computes the precise length according to the rough length and the phase error, and measures the jitters from the precise length by filters.
    Type: Grant
    Filed: March 18, 2010
    Date of Patent: October 23, 2012
    Assignee: Mediatek Inc.
    Inventors: Ming-Yang Chao, Szu-Shan Lo