Abstract: A method of determining far-field performance of an RFID device, such as in or on a tag, label, package, film, carton, wrap, or a portion of any of these, includes performing near-field testing or measurement of the RFID device, and determining or predicting far-field performance based on the results of the near-field testing or measurement. The determining or predicting of far-field performance may involve calculating a measure of far-field performance based on near-field results or measurements. The predicted far-field performance may include any of a variety of performance factors, including range, sensitivity, frequency performance, read sensitivity, write sensitivity, peak operating frequency, and/or average sensitivity over a given frequency band. Using near-field testing results to predict far-field performance may allow use of compact testing facilities, in situ testing of RFID devices, and/or faster and/or less costly testing of RFID devices.