Abstract: Algorithms are set forth for positioning critical test signal pins in a short-wire board test fixture so as to efficiently minimize ground bounce. The board test fixture interfaces a test system to a circuit board under test. Critical signals are those signals susceptible to ground bounce. The test signal pins connect a ground plane in the board test fixture to pin cards interfaced to the board test system. Each pin card has a first column of test signal pins and a set of first ground pins. Moreover, each pin card has a second column comprising a set of second ground pins. In order to minimize ground bounce, no more than fifteen second ground pins per pin card are inactive. No more than two consecutive second ground pins per pin card are inactive. Any critical test signals are assigned within three pins of an exclusive first ground pin. Finally, any ordinary test signals are assigned more than four pins from any critical test signals.