Abstract: In some embodiments, the present disclosure relates to a semiconductor device comprising a source and drain region arranged within a substrate. A conductive gate is disposed over a doped region of the substrate. A gate dielectric layer is disposed between the source region and the drain region and separates the conductive gate from the doped region. A bottommost surface of the gate dielectric layer is below a topmost surface of the substrate. First and second sidewall spacers are arranged along first and second sides of the conductive gate, respectively. An inner portion of the first sidewall spacer and an inner portion of the second sidewall spacer respectively cover a first and second top surface of the gate dielectric layer. A drain extension region and a source extension region respectively separate the drain region and the source region from the gate dielectric layer.

Abstract: The contact lens case structure includes a main body, a number of elastic members, a number of carrier members, a number of cover members, and a number of hollowed-out pressing members. The main body has a number of accommodation spaces. Each elastic member is housed in an accommodation space. A contact lens is placed on a carrier member which in turn is placed on an elastic member. Each pressing member is housed inside a cover member. Each accommodation space is filled with solution. Each cover member is joined to an accommodation space. Each pressing member presses a top side of a carrier member, which in turn compresses an elastic member so that the contact lens is immersed in the solution. The contact lens is held between the pressing member and the carrier member with enhanced cleaning and sterilization effect and is prevented from deformation.

Abstract: The contact lens case structure includes a main body, a number of elastic members, a number of carrier members, a number of cover members, and a number of hollowed-out pressing members. The main body has a number of accommodation spaces. Each elastic member is housed in an accommodation space. A contact lens is placed on a carrier member which in turn is placed on an elastic member. Each pressing member is housed inside a cover member. Each accommodation space is filled with solution. Each cover member is joined to an accommodation space. Each pressing member presses a top side of a carrier member, which in turn compresses an elastic member so that the contact lens is immersed in the solution. The contact lens is held between the pressing member and the carrier member with enhanced cleaning and sterilization effect and is prevented from deformation.

Abstract: A contact lens case structure includes: a main body, one end thereof being open and another end thereof being closed to form an accommodation space, at least one elastic element being configured inside the main body, and one end of the elastic element being configured with a carrier configured with holes; and a cover, in connection with the open end of the main body to close the accommodation space, and at least one positioning portion being configured inside the cover. The positioning portions press the carrier downward to compress the elastic elements, thereby accepting a contact lens in the accommodation space. When the cover is separated from the case, an elastic restoring force of the elastic element pushes the carrier upward to move the contact lens to the top end of the main body in such a way to be convenient for a user to take it out.

Abstract: A management system and method. The system comprises at least one delivery request, a plurality of equipment and a simulator. The delivery request indicates a plurality of devices, each comprising a respective quantity. The equipment tests the devices, each equipment comprising an equipment configuration. The simulator retrieves device configuration requirements of respective devices, maps the devices to the equipment according to the respective device configuration requirements and the equipment configurations to obtain a mapping result, and calculates at least one performance index based on the mapping result and the quantity of respective devices.

Abstract: A management system and method. The system comprises at least one delivery request, a plurality of equipment and a simulator. The delivery request indicates a plurality of devices, each comprising a respective quantity. The equipment tests the devices, each equipment comprising an equipment configuration. The simulator retrieves device configuration requirements of respective devices, maps the devices to the equipment according to the respective device configuration requirements and the equipment configurations to obtain a mapping result, and calculates at least one performance index based on the mapping result and the quantity of respective devices.

Abstract: A method of calculating lot hold time. First, identification parameters of a lot are input. The lot may be a split child lot or an unsplit parent lot. The identification parameters include an identification code and a customer hold code of the lot. The identification code identifies the lot type. The customer hold code identifies the holder. Lot hold time is then calculated according to the identification parameters. Finally, the lot hold time is output for further utilization.

Abstract: A method and system for flexible, comprehensive, on-line, real-time dynamic lot dispatching in a semiconductor test foundry based on a two-phased, event-driven dispatching system structure. An adjustable priority formula and tuned algorithms integrated with PROMIS' constraint function give a nearly optimum dispatching list on any tester at any time with reduced mistake operations. Exception rules take care of special events to improve daily dispatching manual effort. This invention can automatically dispatch engineering lots according to engineering lots' capacity of Testing, solve conflict between wafer and package lots, efficiently reduce tester setup times, replace daily manual-dispatching sheet and keep a high CLIP rate while fully following MPS.

Abstract: A method of calculating lot hold time. First, identification parameters of a lot are input. The lot may be a split child lot or an unsplit parent lot. The identification parameters include an identification code and a customer hold code of the lot. The identification code identifies the lot type. The customer hold code identifies the holder. Lot hold time is then calculated according to the identification parameters. Finally, the lot hold time is output for further utilization.

Abstract: A method and apparatus for simulating the functioning of various configurations of fabrication and test equipment within a manufacturing line creates a schedule for dispatching of the production lots to the manufacturing line. Based on the product mix forecast, the product volume forecast, the predicted sales schedule, the sales confidence, the actual sales order descriptions, and the product delivery schedule, a potential product dispatch schedule is established that enables a product to be fabricated within the manufacturing line. An equipment dispatch schedule for equipment employed in fabrication and testing of the product to be fabricated is defined according to the product dispatch schedule. The potential product dispatch schedule is then simulated based on the process and test equipment model. Upon completion of the simulation, the potential product dispatch schedule is assessed for optimization.

Abstract: A method and system for flexible, comprehensive, on-line, real-time dynamic lot dispatching in a semiconductor test foundry based on a two-phased, event-driven dispatching system structure. An adjustable priority formula and tuned algorithms integrated with PROMIS' constraint function give a nearly optimum dispatching list on any tester at any time with reduced mistake operations. Exception rules take care of special events to improve daily dispatching manual effort. This invention can automatically dispatch engineering lots according to engineering lots' capacity of Testing, solve conflict between wafer and package lots, efficiently reduce tester setup times, replace daily manual-dispatching sheet and keep a high CLIP rate while fully following MPS.

Abstract: A balustrade including a handrail supported on a row of balusters, each of which is attached with two cross bars at different heights, and a plurality of vertical axles respectively connected to the cross bars between each two adjacent balusters by connectors, wherein each connector has a transverse rod on one end respectively and movably inserted into an axial hole on the respective cross bar, and an axle hole on an opposite end at right angle to the axial hole and through which a respective vertical axle is inserted and secured in place by a tapping screw.