Abstract: A test socket for an integrated circuit includes a frame body, a number of electrical contacts, two sliding plates, a mechanism for slidingly moving the sliding plates in a horizontal direction, and two elastic elements. When applying a force to the mechanism, the sliding plates slide away from each other to make each ball contact of a ball grid array integrated circuit move downwardly into an associated through-hole of the sliding plate. When the force is removed, returning forces provided by the elastic elements return the sliding plates to their close contact status, and each ball contact is born against by an associated electrical contact and thus retained in the associated through-hole of the sliding plate such that signals from the ball contacts can be outputted via the electrical contacts.