Patents by Inventor Tad M. Heppner

Tad M. Heppner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for statistical analysis of comparative entropy
    Patent number: 11157617
    Abstract: In accordance with one embodiment of the present disclosure, a method for determining the similarity between a first data set and a second data set is provided. The method includes performing an entropy analysis on the first and second data sets to produce a first entropy result, wherein the first data set comprises data representative of a first one or more computer files of known content and the second data set comprises data representative of a one or more computer files of unknown content; analyzing the first entropy result; and if the first entropy result is within a predetermined threshold, identifying the second data set as substantially related to the first data set.
    Type: Grant
    Filed: September 19, 2019
    Date of Patent: October 26, 2021
    Assignee: McAfee, LLC
    Inventors: David Neill Beveridge, Abhishek Ajay Karnik, Kevin A. Beets, Tad M. Heppner, Karthik Raman
  • SYSTEM AND METHOD FOR STATISTICAL ANALYSIS OF COMPARATIVE ENTROPY
    Publication number: 20200012792
    Abstract: In accordance with one embodiment of the present disclosure, a method for determining the similarity between a first data set and a second data set is provided. The method includes performing an entropy analysis on the first and second data sets to produce a first entropy result, wherein the first data set comprises data representative of a first one or more computer files of known content and the second data set comprises data representative of a one or more computer files of unknown content; analyzing the first entropy result; and if the first entropy result is within a predetermined threshold, identifying the second data set as substantially related to the first data set.
    Type: Application
    Filed: September 19, 2019
    Publication date: January 9, 2020
    Inventors: David Neill Beveridge, Abhishek Ajay Karnik, Kevin A. Beets, Tad M. Heppner, Karthik Raman
  • System and method for statistical analysis of comparative entropy
    Patent number: 10423786
    Abstract: In accordance with one embodiment of the present disclosure, a method for determining the similarity between a first data set and a second data set is provided. The method includes performing an entropy analysis on the first and second data sets to produce a first entropy result, wherein the first data set comprises data representative of a first one or more computer files of known content and the second data set comprises data representative of a one or more computer files of unknown content; analyzing the first entropy result; and if the first entropy result is within a predetermined threshold, identifying the second data set as substantially related to the first data set.
    Type: Grant
    Filed: November 15, 2016
    Date of Patent: September 24, 2019
    Assignee: McAfee, LLC
    Inventors: David Neill Beveridge, Abhishek Ajay Karnik, Kevin A. Beets, Tad M. Heppner, Karthik Raman
  • SYSTEM AND METHOD FOR STATISTICAL ANALYSIS OF COMPARATIVE ENTROPY
    Publication number: 20170061125
    Abstract: In accordance with one embodiment of the present disclosure, a method for determining the similarity between a first data set and a second data set is provided. The method includes performing an entropy analysis on the first and second data sets to produce a first entropy result, wherein the first data set comprises data representative of a first one or more computer files of known content and the second data set comprises data representative of a one or more computer files of unknown content; analyzing the first entropy result; and if the first entropy result is within a predetermined threshold, identifying the second data set as substantially related to the first data set.
    Type: Application
    Filed: November 15, 2016
    Publication date: March 2, 2017
    Inventors: David Neill Beveridge, Abhishek Ajay Karnik, Kevin A. Beets, Tad M. Heppner, Karthik Raman
  • System and method for statistical analysis of comparative entropy
    Patent number: 9501640
    Abstract: In accordance with one embodiment of the present disclosure, a method for determining the similarity between a first data set and a second data set is provided. The method includes performing an entropy analysis on the first and second data sets to produce a first entropy result, wherein the first data set comprises data representative of a first one or more computer files of known content and the second data set comprises data representative of a one or more computer files of unknown content; analyzing the first entropy result; and if the first entropy result is within a predetermined threshold, identifying the second data set as substantially related to the first data set.
    Type: Grant
    Filed: September 14, 2011
    Date of Patent: November 22, 2016
    Assignee: McAfee, Inc.
    Inventors: David Neill Beveridge, Abhishek Ajay Karnik, Kevin A. Beets, Tad M. Heppner, Karthik Raman
  • System and Method for Statistical Analysis of Comparative Entropy
    Publication number: 20130067579
    Abstract: In accordance with one embodiment of the present disclosure, a method for determining the similarity between a first data set and a second data set is provided. The method includes performing an entropy analysis on the first and second data sets to produce a first entropy result, wherein the first data set comprises data representative of a first one or more computer files of known content and the second data set comprises data representative of a one or more computer files of unknown content; analyzing the first entropy result; and if the first entropy result is within a predetermined threshold, identifying the second data set as substantially related to the first data set.
    Type: Application
    Filed: September 14, 2011
    Publication date: March 14, 2013
    Inventors: David Neill Beveridge, Abhishek Ajay Karnik, Kevin A. Beets, Tad M. Heppner, Karthik Raman