Abstract: A laminated film including a resin layer on at least one side of a resin base film, the resin layer being present at least one surface, wherein the X-ray absorption near edge structure (XANES) spectrum at the carbon K absorption edge at the resin layer surface satisfies I(15°)?I(90°)?0.1 when the angle formed between the incident X-ray and the resin layer surface is defined as ?, and the spectral intensity at 293.5 eV obtained by the partial electron yield method is defined as I(?). Provided is a laminated film as a release film to be used in an application that is carried out by coating the film with a coating liquid including a solvent, drying and solidifying the coating liquid, and then peeling off the solidified coating, which laminated film shows excellent applicability and an excellent peeling property, and does not show delamination of the surface layer even after a heating process.

Abstract: A laminated film has a resin layer on at least one surface of a polyester film, in which the resin layer is on at least one surface layer, the water contact angle of the resin layer is 85°-100°, inclusive, and |H2-H1|?1.0 (%) is satisfied, H1 (%) being the haze of the laminated film and H2 (%) being the haze of the laminated film after being immersed in a solvent and subjected to a rub test. This laminated film has excellent coating and releasability properties with respect to ceramic slurry.

Abstract: A laminated film has a resin layer on at least one surface of a polyester film, in which the resin layer is on at least one surface layer, the water contact angle of the resin layer is 85°-100°, inclusive, and |H2?H1|?1.0 (%) is satisfied, H1 (%) being the haze of the laminated film and H2 (%) being the haze of the laminated film after being immersed in a solvent and subjected to a rub test. This laminated film has excellent coating and releasability properties with respect to ceramic slurry.

Abstract: A forming material having a layer on at least one of surfaces of a support substrate material, wherein the layer contains a fluorine-containing compound, and has a 60-degree specular gloss level prescribed in JIS Z8741 (1997 edition) greater than or equal to 60%, and the layer has a surface property with a number of peaks exceeding a root-mean-square roughness (Rq) observed under an atomic force microscope (AFM) greater than or equal to 500 and less than or equal to 1500 per 25 ?m2.

Abstract: A laminated body is a laminated body that has in this order a second layer and a first layer with different indices of refraction on at least one surface of a supporting base material, and the first layer contains particles X (particles X being particles having at least an inorganic particle part), with the second layer containing particles Y (particles Y being particles having at least an inorganic particle part) and is characterized by the number average particle size (DX in the following) for the inorganic particle parts for the particles X being 5-25 nm and by Equations 1 and 2 being satisfied: 1.4?(LX/DX)?3??1 SLX?7??2.

Abstract: A laminated body is a laminated body that has in this order a second layer and a first layer with different indices of refraction on at least one surface of a supporting base material, and the first layer contains particles X (particles X being particles having at least an inorganic particle part), with the second layer containing particles Y (particles Y being particles having at least an inorganic particle part) and is characterized by the number average particle size (DX in the following) for the inorganic particle parts for the particles X being 5-25 nm and by Equations 1 and 2 being satisfied: 1.4?(LX/DX)?3??1 SLX?7??2.

Abstract: A forming material having a layer on at least one of surfaces of a support substrate material, wherein the layer contains a fluorine-containing compound, and has a 60-degree specular gloss level prescribed in JIS Z8741 (1997 edition) greater than or equal to 60%, and the layer has a surface property with a number of peaks exceeding a root-mean-square roughness (Rq) observed under an atomic force microscope (AFM) greater than or equal to 500 and less than or equal to 1500 per 25 ?m2.