Patents by Inventor Tadahiro Echigo

Tadahiro Echigo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Film thickness measuring method and measuring apparatus for organic thin film for use in organic electroluminesce device
    Patent number: 6992781
    Abstract: A method for measuring a relative thickness distribution of an organic thin film for use in an organic electroluminescence device comprises the steps of irradiating a predetermined region of the organic thin film with a light including an ultraviolet light, measuring the intensity of a fluorescence produced by the organic thin film in response to the light irradiation, and obtaining a film thickness of the predetermined region from the intensity of the fluorescence. Further, an apparatus for measuring a thickness distribution for use in an organic electroluminescence device has means for irradiating a predetermined region of the organic thin film with a light including an ultraviolet light, means for measuring the intensity of a fluorescence produced by the organic thin film, and means for obtaining the film thickness of the predetermined region from the intensity of the fluorescence.
    Type: Grant
    Filed: March 18, 2003
    Date of Patent: January 31, 2006
    Assignee: President of Toyama University
    Inventors: Hiroyuki Okada, Miki Shibata, Tadahiro Echigo, Shigeki Naka, Hiroyoshi Onnagawa
  • Method of manufacturing organic electroluminescent device
    Patent number: 6756249
    Abstract: A method of manufacturing an organic electroluminescent device has the steps of forming a first electrode on a substrate, preparing a solution containing a hole transport organic material, an electron transport organic material and a luminescent organic material, followed by spraying the solution onto the first electrode by using a pressurized gas so as to form an organic thin film layer, and forming a second electrode on the organic thin film layer.
    Type: Grant
    Filed: October 11, 2002
    Date of Patent: June 29, 2004
    Assignee: President of Toyama University
    Inventors: Shigeki Naka, Tadahiro Echigo, Hiroyuki Okada, Hiroyoshi Onnagawa
  • Film thickness measuring method and measuring apparatus for organic thin film for use in organic electroluminesce device
    Publication number: 20030193672
    Abstract: A method for measuring a relative thickness distribution of an organic thin film for use in an organic electroluminescence device comprises the steps of irradiating a predetermined region of the organic thin film with a light including an ultraviolet light, measuring the intensity of a fluorescence produced by the organic thin film in response to the light irradiation, and obtaining a film thickness of the predetermined region from the intensity of the fluorescence. Further, an apparatus for measuring a thickness distribution for use in an organic electroluminescence device has means for irradiating a predetermined region of the organic thin film with a light including an ultraviolet light, means for measuring the intensity of a fluorescence produced by the organic thin film, and means for obtaining the film thickness of the predetermined region from the intensity of the fluorescence.
    Type: Application
    Filed: March 18, 2003
    Publication date: October 16, 2003
    Inventors: Hiroyuki Okada, Miki Shibata, Tadahiro Echigo, Shigeki Naka, Hiroyoshi Onnagawa
  • Method of manufacturing organic electroluminescent device
    Publication number: 20030087464
    Abstract: A method of manufacturing an organic electroluminescent device has the steps of forming a first electrode on a substrate, preparing a solution containing a hole transport organic material, an electron transport organic material and a luminescent organic material, followed by spraying the solution onto the first electrode by using a pressurized gas so as to form an organic thin film layer, and forming a second electrode on the organic thin film layer.
    Type: Application
    Filed: October 11, 2002
    Publication date: May 8, 2003
    Inventors: Shigeki Naka, Tadahiro Echigo, Hiroyuki Okada, Hiroyoshi Onnagawa