Patents by Inventor Tadahiro Saitoh

Tadahiro Saitoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6487682
    Abstract: A semiconductor integrated circuit includes a semiconductor chip body, a plurality of input/output cells arranged on a surface of the semiconductor chip body at parts including a peripheral part and a central part the semiconductor chip body, and at least an internal logic circuit provided on the semiconductor chip body. Each of the input/output cells include a pad and a holding circuit coupled to the pad for holding incoming data. A plurality of holding circuits are coupled in series in a test mode to form a scan path circuit. The input/output cell which has the pad for receiving an external test signal in a test mode is arranged at the peripheral part of the semiconductor chip body, and the test data held in the holding circuit of the input/output cell which is arranged at a part other than the peripheral part of the semiconductor chip body is transferred to the internal logic circuit in the test mode.
    Type: Grant
    Filed: September 17, 1992
    Date of Patent: November 26, 2002
    Assignee: Fujitsu Limited
    Inventors: Takeshi Yamamura, Tadahiro Saitoh, Kazuhiro Kobayashi
  • Publication number: 20020049927
    Abstract: A semiconductor integrated circuit includes a semiconductor chip body, a plurality of input/output cells arranged on a surface of the semiconductor chip body at parts including a peripheral part and a central part the semiconductor chip body, and at least an internal logic circuit provided on the semiconductor chip body. Each of the input/output cells include a pad and a holding circuit coupled to the pad for holding incoming data. A plurality of holding circuits are coupled in series in a test mode to form a scan path circuit. The input/output cell which has the pad for receiving an external test signal in a test mode is arranged at the peripheral part of the semiconductor chip body, and the test data held in the holding circuit of the input/output cell which is arranged at a part other than the peripheral part of the semiconductor chip body is transferred to the internal logic circuit in the test mode.
    Type: Application
    Filed: September 17, 1992
    Publication date: April 25, 2002
    Inventors: TAKESHI YAMAMURA, TADAHIRO SAITOH, KAZUHIRO KOBAYASHI
  • Patent number: 5281835
    Abstract: A semi-custom integrated circuit comprises a basic cell array comprising a plurality of basic cells aligned in a first direction, the basic cells comprising a transistor unit, a capacitor unit and a resistor unit arranged in a second direction perpendicular to the first direction. The transistor unit is positioned between the capacitor unit and the resistor unit. The transistor unit has a terminal portion for connection of wiring, the capacitor unit having a terminal portion for connection of wiring, the resistor unit having a terminal portion for connection of wiring. The terminal portions of said transistor unit, capacitor unit and resistor unit are aligned along a line.
    Type: Grant
    Filed: January 27, 1992
    Date of Patent: January 25, 1994
    Assignee: Fujitsu Limited
    Inventors: Masayoshi Tomita, Tadahiro Saitoh, Kiyokazu Hasegawa, Noboru Kosugi