Abstract: Under the conditions that an abrasive cleaning gel film having an abrasive cleaning gel layer and being configured to be stuck to a surface or a container filled with a viscous fluid or a gel fluid in which fine abrasive grains are mixed and dispersed is attached to a vibrating surface of an ultrasonic transducer, and an axial direction of a probe for test is matched with a vibrating direction of the ultrasonic transducer, a tip of the probe is penetrated to a predetermined depth in the abrasive cleaning gel layer or the viscous fluid in which the fine abrasive grains are mixed and dispersed at a constant speed and then pulled up at a constant speed, whereby the tip of the probe can be formed into a conical shape.

Abstract: The present invention is intended to provide a vertical probe and a jig which has sufficient flexibility for contact reaction force from the electrical contact to be inspected, easy insertion and assembly of the probe even with narrow pitch, and enables cost reduction and delivery time reduction, wherein means for driving and positioning relative positions of upper and lower hole plates is provided, the straight pins as materials of vertical probes are inserted into the upper and lower hole plates, plastic deformation is applied to the straight pin by driving and positioning the relative position of the upper and lower hole plates, a symmetrical arched shape is provided, and a bending point is formed in the vicinity of the lower side of the upper hole plate and in the vicinity of the upper side of the lower hole plate.

Abstract: The present invention is intended to provide a vertical probe and a jig which has sufficient flexibility for contact reaction force from the electrical contact to be inspected, easy insertion and assembly of the probe even with narrow pitch, and enables cost reduction and delivery time reduction, wherein means for driving and positioning relative positions of upper and lower hole plates is provided, the straight pins as materials of vertical probes are inserted into the upper and lower hole plates, plastic deformation is applied to the straight pin by driving and positioning the relative position of the upper and lower hole plates, a symmetrical arched shape is provided, and a bending point is formed in the vicinity of the lower side of the upper hole plate and in the vicinity of the upper side of the lower hole plate.

Abstract: This is to provide a method for manufacturing an inspection probe in which qualities of a bonded portion of the inspection probe constituted by bonding wire rods including different metals are improved. The method for manufacturing an inspection probe is configured by bonding a first wire rod 110 and a second wire rod 120, at least one of which has an inspection contact portion at a tip thereof, performing laser welding by irradiating laser beam to outer circumferential surfaces of the first wire rod and the second wire rod with different energy quantities, and then, polishing the outer circumferential surfaces.

Abstract: A potential sensor, includes a field effect transistor, a power supply and a switching device. The power supply supplies a direct current voltage to a gate electrode of the field effect transistor. The switching device switches between connecting the gate electrode to the power supply and disconnecting the gate electrode from the power supply. When the gate electrode is connected to the power supply, the field effect transistor is in action. When the gate electrode is disconnected from the power supply, the field effect transistor is in action.

Abstract: A potential sensor, includes a field effect transistor, a power supply and a switching device. The power supply supplies a direct current voltage to a gate electrode of the field effect transistor. The switching device switches between connecting the gate electrode to the power supply and disconnecting the gate electrode from the power supply. When the gate electrode is connected to the power supply, the field effect transistor is in action. When the gate electrode is disconnected from the power supply, the field effect transistor is in action.

Abstract: A DC or high frequency ion source comprising a hollow cathode and a substantially hollow anode for applying a DC or alternating voltage; a gas inlet disposed at a first side of the cathode for supplying a discharge gas into the cathode; a cathode heater disposed between the anode and the cathode; a magnet disposed adjacent the anode to thereby improve the uniformity of a plasma; an ion extraction outlet disposed at a second side of the cathode opposite to the gas inlet and having an elongated rectangular shape; and an ion extraction electrode and an acceleration electrode for controlling the energy of extracted ions. Both the anode and cathode comprise substantially hollow boxes. The cathode includes an elongated rectangular cross section and is disposed inside the substantially hollow anode. The ion extraction electrode and the acceleration electrode have an elongated rectangular shape and an opening coextensive with the ion extraction outlet.

Abstract: A sputtering apparatus including two electrodes, a sputtering target disposed on one of the electrodes, and a gas supply for supplying a discharge gas in a vacuum to produce an electric discharge between the two electrodes and whereby particles sputtered from the target due to impact thereon of ions produced by the discharge, are deposited on a substrate. The target disposed on one electrode is formed into an elongated band and the other electrode is disposed so as to enclose the target. The other electrode is also provided with a magnet for producing a magnetic field thereon, and further includes a narrow elongated slot which defines a narrow sputter particle outlet. The narrow sputter particle outlet permits a pressure to exist near the electrical discharge which is higher than the pressure near the substrate. According to a preferred embodiment, the sputtering apparatus has an ion source combined integrally therewith.

Abstract: A balancer of a reciprocating machine having crank mechanisms includes an adjusting weight having one end supported by a reciprocating portion of a crank mechanism for the balancer. An adjusting weight support rotatably supports the other end of the adjusting weight with respect to a stationary portion of a body frame. The adjusting weight support is equipped with a weight support position altering mechanism for permitting alteration of the support position of the adjusting weight.

Abstract: The helical guide apparatus includes a main spindle, a male pattern, a first female pattern and a second female pattern which are operatively associated with one another. As the main spindle adapted to reciprocably move in the axial direction and rotate in the circumferential direction is reciprocably driven in the axial direction by first reciprocable driving means, it carries out reciprocable rotational movement in accordance with a lead which is determined by a combination of the first helical projection on the male pattern and the first helical recess on the first female pattern.

Abstract: An improved chip disposer which removes chips or iron chips produced from a machine tool by using magnetic force is disclosed.