Patents by Inventor Tadashiro Ohmi

Tadashiro Ohmi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

Reflection electron diffractometer and method for observing microscopic surface structure

Patent number: 5093573

Abstract: An improved RHEED apparatus and a method for observing step-like surface irregularities of a sample by the use of the improved RHEED apparatus.

Type: Grant

Filed: June 4, 1990

Date of Patent: March 3, 1992

Inventors: Nobuo Mikoshiba, Tadashiro Ohmi, Kazuo Tsubouchi, Kazuya Masu

Reflection electron diffractometer and method for observing microscopic surface structure