Patents by Inventor Tadeusz Kryszczynski

Tadeusz Kryszczynski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Multi-channel spectrum analyzer
    Patent number: 7315371
    Abstract: A spectrum analyzer for the simultaneous analysis of electromagnetic radiation delivered to it from either multiple sources or from a linear segment along a source surface, and arranged as either continuous or discrete set of points along a short piece of a straight line referred to herein as a slit. In one embodiment of the invention, the optical design of the dispersing part of the analyzer provides essentially stigmatic spots for any spectral band up to one octave wide in the spectral range of about 400 nm to about 2500 nm.
    Type: Grant
    Filed: January 23, 2004
    Date of Patent: January 1, 2008
    Assignee: P&P Optica Inc.
    Inventors: Tadeusz Kryszczynski, Olga Pawluczyk, Rafal Pawluczyk
  • Multi-channel spectrum analyzer
    Publication number: 20050162649
    Abstract: A spectrum analyzer for the simultaneous analysis of electromagnetic radiation delivered to it from either multiple sources or from a linear segment along a source surface, and arranged as either continuous or discrete set of points along a short piece of a straight line referred to herein as a slit. In one embodiment of the invention, the optical design of the dispersing part of the analyzer provides essentially stigmatic spots for any spectral band up to one octave wide in the spectral range of about 400 nm to about 2500 nm.
    Type: Application
    Filed: January 23, 2004
    Publication date: July 28, 2005
    Applicant: P&P Optica Inc.
    Inventors: Tadeusz Kryszczynski, Olga Pawluczyk, Rafal Pawluczyk