Abstract: A semiconductor wafer analyzing device and semiconductor wafer analyzing system are disclosed that provide estimated analysis values of unit areas that are not measured in a target wafer. The device and system calculate estimated analysis values based on measured analysis values of unit areas in a basic wafer and measured analysis values of some unit areas in the target wafer.

Abstract: A display device may include a main flexible printed circuit including a first alignment mark and electrically connected to a first panel; and a touch flexible printed circuit including a second alignment mark and electrically connected to a second panel that is perpendicular to the first panel, wherein the main flexible printed circuit is electrically connected to the touch flexible printed circuit through a pad region, and the touch flexible printed circuit includes a first overcoat region disposed between the first alignment mark and the second alignment mark.

Abstract: A display device may include a main flexible printed circuit including a first alignment mark and electrically connected to a first panel; and a touch flexible printed circuit including a second alignment mark and electrically connected to a second panel that is perpendicular to the first panel, wherein the main flexible printed circuit is electrically connected to the touch flexible printed circuit through a pad region, and the touch flexible printed circuit includes a first overcoat region disposed between the first alignment mark and the second alignment mark.

Abstract: A display device may include a main flexible printed circuit including a first alignment mark and electrically connected to a first panel; and a touch flexible printed circuit including a second alignment mark and electrically connected to a second panel that is perpendicular to the first panel, wherein the main flexible printed circuit is electrically connected to the touch flexible printed circuit through a pad region, and the touch flexible printed circuit includes a first overcoat region disposed between the first alignment mark and the second alignment mark.

Abstract: Provided is a method for controlling a time division duplexing (TDD) Tx/Rx switching timing in a cloud radio access network (CRAN) that can finely control a switching timing between transmission and reception of TDD signals with an additional component added to a digital unit (DU) and a radio unit (RU) in the CRAN.

Abstract: Provided is a method for controlling a time division duplexing (TDD) Tx/Rx switching timing in a cloud radio access network (CRAN) that can finely control a switching timing between transmission and reception of TDD signals with an additional component added to a digital unit (DU) and a radio unit (RU) in the CRAN.

Abstract: Disclosed is a method for reading data in a memory system including a buffer memory and a nonvolatile memory, the method being comprised of: determining whether an input address in a read request is allocated to the buffer memory; determining whether a size of requested data is larger than a reference unless the input address is allocated to the buffer memory; and conducting a prefetch reading operation from the nonvolatile memory if the requested data size is larger than the reference.

Abstract: Disclosed is a method for reading data in a memory system including a buffer memory and a nonvolatile memory, the method being comprised of: determining whether an input address in a read request is allocated to the buffer memory; determining whether a size of requested data is larger than a reference unless the input address is allocated to the buffer memory; and conducting a prefetch reading operation from the nonvolatile memory if the requested data size is larger than the reference.

Abstract: Disclosed is a method for reading data in a memory system including a buffer memory and a nonvolatile memory, the method being comprised of: determining whether an input address in a read request is allocated to the buffer memory; determining whether a size of requested data is larger than a reference unless the input address is allocated to the buffer memory; and conducting a prefetch reading operation from the nonvolatile memory if the requested data size is larger than the reference.

Abstract: Disclosed is a method for reading data in a memory system including a buffer memory and a nonvolatile memory, the method being comprised of: determining whether an input address in a read request is allocated to the buffer memory; determining whether a size of requested data is larger than a reference unless the input address is allocated to the buffer memory; and conducting a prefetch reading operation from the nonvolatile memory if the requested data size is larger than the reference.