Patents by Inventor Tae Bong Eom

Tae Bong Eom has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7268886
    Abstract: Disclosed herein is a method and apparatus for simultaneously measuring a displacement and angular variations. The method and apparatus of the present invention allows light radiated from a single light source to be placed along a light axis so as to simultaneously measure a distance (displacement) and angular variations that are different physical quantities, so that the displacement and angular variations of the measuring device of a precision measuring apparatus or machining device of a machine tool moved by a stage can be simultaneously measured without an Abbe error.
    Type: Grant
    Filed: June 24, 2004
    Date of Patent: September 11, 2007
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Jae Wan Kim, Tae Bong Eom
  • Patent number: 6713743
    Abstract: Disclosed is an atomic force microscope. A Fabry-Perot interferometer where the intensity of light reflected at a cantilever through an optical fiber varies sensitively to a displacement of the cantilever is constructed to accurately measure a distance between the optical fiber and the cantilever. A Fabry-Perot resonator is formed by the optical fiber having an end of a concave mirror shape and a reflective surface of the cantilever. A displacement of a cantilever tip is measured by detecting a signal reflected at the resonator and a feedback signal corresponding to a variation in the displacement of the cantilever tip is generated. The displacement of the cantilever tip is kept constant by actuating a piezoelectric element in a Z-axis direction.
    Type: Grant
    Filed: June 9, 2003
    Date of Patent: March 30, 2004
    Assignee: Korea Research Institute of Standards and Science
    Inventors: Jae Wan Kim, Tae Bong Eom
  • Publication number: 20030226955
    Abstract: Disclosed is an atomic force microscope. A Fabry-Perot interferometer where the intensity of light reflected at a cantilever through an optical fiber varies sensitively to a displacement of the cantilever is constructed to accurately measure a distance between the optical fiber and the cantilever. A Fabry-Perot resonator is formed by the optical fiber having an end of a concave mirror shape and a reflective surface of the cantilever. A displacement of a cantilever tip is measured by detecting a signal reflected at the resonator and a feedback signal corresponding to a variation in the displacement of the cantilever tip is generated. The displacement of the cantilever tip is kept constant by actuating a piezoelectric element in a Z-axis direction.
    Type: Application
    Filed: June 9, 2003
    Publication date: December 11, 2003
    Inventors: Jae Wan Kim, Tae Bong Eom
  • Publication number: 20030030816
    Abstract: Disclosed is a method for correcting a nonlinearity error in a two-frequency laser interferometer which measures the phase angle using 90° phase mixing technique and a method for measuring a phase angle by using the same. The phase angle correcting method includes the steps of: calculating ellipse parameters, such as amplitudes, offsets and a phase difference of two sine and cosine output signals from the nonlinearity error correcting electronics; calculating an adjusting voltages for correcting offsets, amplitudes and a phase of the output signals; conducting a correction wherein offsets of output signals become zero, amplitudes are same, and a phase difference beyond 90° between the output signals becomes zero; and applying the output signals whose offsets, amplitudes and phase are corrected to Equation (&thgr;=arctan(Iy′/Ix′)) to calculate the phase angle.
    Type: Application
    Filed: January 17, 2002
    Publication date: February 13, 2003
    Inventors: Tae Bong Eom, Ho Suhng Suh, Tae Young Choi