Abstract: The present invention discloses an image decoding method, the method including generating a candidate list including motion information derived from a spatial neighboring block and a temporal neighboring block adjacent to a current block; deriving motion information of the current block using the candidate list; generating a prediction block of the current block using the derived motion information; and updating the derived motion information in a motion information list, wherein the generating of the candidate list is performed in such a manner as to include at least one information of the motion information included in the updated motion information list in a block decoded before the current block.

Abstract: The present disclosure relates to an organic electroluminescent device. The organic electroluminescent device of the present disclosure shows high luminous efficiency and good lifespan by comprising a specific combination of the plural kinds of host compounds and a specific hole transport compound.

Abstract: A cell-to-cell comparison method for inspecting a defect in a subject in which unit cells that may be expressed by a two-dimensional (2D) vector are periodically arranged according to an embodiment of the present invention includes: obtaining an image of the subject including an array of the unit cells; generating a tile that is a set of pixels corresponding to the same position in a plurality of unit cells within the array in the image; determining a gray level of each of a plurality of pixels within the tile; and determining whether the plurality of pixels within the tile are defective on the basis of the determined gray level of each of the plurality of pixels.

Abstract: A battery load management system and methods of managing a battery load, e.g., in a vehicle, may be directed to a converter that steps down electrical power from an input voltage to a reduced voltage. An electrical bus in electrical communication with the converter may be configured to supply electrical power received from the converter at the reduced voltage to a plurality of electrical loads. A controller may be configured to detect a load shed trigger, and in response to the detection select one or more low-priority loads included in the plurality of electrical loads. The controller may also be configured to reduce electrical power consumption by the one or more low-priority loads.

Abstract: A battery load management system and methods of managing a battery load, e.g., in a vehicle, may be directed to a converter that steps down electrical power from an input voltage to a reduced voltage. An electrical bus in electrical communication with the converter may be configured to supply electrical power received from the converter at the reduced voltage to a plurality of electrical loads. A controller may be configured to detect a load shed trigger, and in response to the detection select one or more low-priority loads included in the plurality of electrical loads. The controller may also be configured to reduce electrical power consumption by the one or more low-priority loads.

Abstract: ProA wafer image inspection apparatus for inspecting defects of a semiconductor wafer comprises: a lighting portion for generating light; a lens portion for obtaining a wafer image, which is reflected after the light has been reflected onto a wafer to be inspected, and delivering the wafer image by lighting same in one direction; a dividing optical element for dividing the wafer image delivered from the lens portion; an image detection portion comprising a plurality of image-capturing elements, which are installed so that images which have passed through the lens portion and the dividing optical element are respectively formed on different focus positions; and an image processing portion for combining the images on different focus positions captured by the plurality of image pick-up elements to form a TSOM image, and comparing the TSOM image with a TSOM image of a normal semiconductor apparatus part to determine whether an object is defective.

Abstract: ProA wafer image inspection apparatus for inspecting defects of a semiconductor wafer comprises: a lighting portion for generating light; a lens portion for obtaining a wafer image, which is reflected after the light has been reflected onto a wafer to be inspected, and delivering the wafer image by lighting same in one direction; a dividing optical element for dividing the wafer image delivered from the lens portion; an image detection portion comprising a plurality of image-capturing elements, which are installed so that images which have passed through the lens portion and the dividing optical element are respectively formed on different focus positions; and an image processing portion for combining the images on different focus positions captured by the plurality of image pick-up elements to form a TSOM image, and comparing the TSOM image with a TSOM image of a normal semiconductor apparatus part to determine whether an object is defective.

Abstract: There are provided a method for producing an electroconductive polymer which can be operated at a low temperature such as the human body temperature, is safe to the human body, and is flexible and useful as a thermoelectric material, and a thermoelectric element including a thin film of an electroconductive polymer produced by the production method.

Abstract: There are provided a method for producing an electroconductive polymer which can be operated at a low temperature such as the human body temperature, is safe to the human body, and is flexible and useful as a thermoelectric material, and a thermoelectric element including a thin film of an electroconductive polymer produced by the production method.

Abstract: A method of manufacturing an electronic device, which can obtain sufficient manufacturing margins and reduce a defect rate by compensating for a threshold voltage variation caused by the variation of a critical dimension (CD) of a gate electrode. An ion implanter controller and an ion implantation system perform the method. In the method, an ion implantation recipe for forming a junction contact plug of a transistor formed on the wafer is adjusted based on the measured CD. Then, ions are implanted into the wafer by using the adjusted ion implantation recipe. All defects that may occur in the transistor during previous manufacturing steps can be repaired after the transistor is formed, thus enhancing manufacturing margins.

Abstract: A film for display device, a filter for display device including the film, and a display device including the filter are disclosed. The film for display device includes a plurality of first portions positioned to be spaced with a predetermined distance therebetween, and a plurality of second portions transmitting light. Each second portion is positioned between the first portions. A refractive index of the first portion is larger than a refractive index of the second portion.

Abstract: A multi-sector in-building repeater, including: a master transmitting unit for receiving multi-sector signals of a carrier from a base station, mixing the multi-sector signals with different transmission intermediate frequency signals, and outputting mixed multi-sector signals to a same transmission line; a plurality of slave transmitting units for extracting sector signals assigned to the multi-sector signals from the master transmitting unit, converting extracted sector signals into high frequency signals, and transmitting converted high frequency signals through an antenna to a mobile terminal.

Abstract: A method for carrying out an idle handoff from a macrocell to a microcell (picocell) in a hierarchical cell structure includes the steps of: a) allocating different frequency assignments (FA) to the macrocell and the microcell in a same service band, to construct the hierarchical cell structure; b) transmitting cell structure information of neighboring base stations and pseudo noise (PN) code from base station to mobile station; c) checking whether the mobile station is in the hierarchical cell by using the cell structure information of neighboring base station; and d) checking whether a value of the pseudo noise (PN) code is greater than T_ADD and greater than Ec/Io of the macrocell by periodically searching the pseudo noise (PN) code of the microcell, to carry out an idle handoff to the microcell, wherein the T_ADD represents a value of base station pilot strength required for the base station of neighboring set to be included in a candidate set, the Ec represents an pilot energy accumulated during one pseu

Abstract: A method of manufacturing an electronic device, which can obtain sufficient manufacturing margins and reduce a defect rate by compensating for a threshold voltage variation caused by the variation of a critical dimension (CD) of a gate electrode. An ion implanter controller and an ion implantation system perform the method. In the method, an ion implantation recipe for forming a junction contact plug of a transistor formed on the wafer is adjusted based on the measured CD. Then, ions are implanted into the wafer by using the adjusted ion implantation recipe.

Abstract: A multi-sector in-building repeater, including: a master transmitting unit for receiving multi-sector signals of a carrier from a base station, mixing the multi-sector signals with different transmission intermediate frequency signals, and outputting mixed multi-sector signals to a same transmission line; a plurality of slave transmitting units for extracting sector signals assigned to the multi-sector signals from the master transmitting unit, converting extracted sector signals into high frequency signals, and transmitting converted high frequency signals through an antenna to a mobile terminal.

Abstract: A macro-micro cell structure of wireless communication system for separately processing a forward and a reverse telecommunications in order to increase a reverse link capacity is disclosed. The wireless telecommunication system has a macro cell and at least one micro cell within the macro cell. A micro cell signal processing unit processes a transmission and reception signal of a mobile station located at a service region of the micro cell. A micro cell base station transmits a micro cell forward signal provided from said micro cell signal processing unit to the mobile station to receive a micro cell reverse signal, and receives a macro cell reverse signal of the mobile station which is located at the macro cell and has a short wave path contrast to the macro cell. A macro cell signal processing unit transmits a forward signal to the mobile station through a macro cell antenna and processes the reverse signal provided from said macro cell antenna or said micro cell base station.