Patents by Inventor Tae Hun Jin

Tae Hun Jin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Verification method by means of comparing internal state traces
    Patent number: 6285914
    Abstract: A chip verification method by comparing internal state traces of chips having various functions, which is capable of reducing the overall chip designing and verifying time and attaining a more exact verification.
    Type: Grant
    Filed: December 29, 1998
    Date of Patent: September 4, 2001
    Assignee: Hyundai Electronics Industries Co., Ltd.
    Inventors: Jong Hong Bae, Tae Hun Jin